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Volumn 28, Issue 5, 2010, Pages 1279-1280
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Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence
b
NONE
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC PERCENT;
AUTOMATED ANALYSIS;
COMPOSITION MEASUREMENTS;
COMPOSITION REPRODUCIBILITY;
COMPOSITION-SPREAD THIN FILMS;
CORNELL HIGH-ENERGY SYNCHROTRON SOURCES;
HIGH THROUGHPUT EXPERIMENTS;
HIGH-THROUGHPUT;
REPRODUCIBILITIES;
X RAY FLUORESCENCE;
FLUORESCENCE;
ZIRCONIA;
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EID: 77956404839
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.3478668 Document Type: Article |
Times cited : (5)
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References (8)
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