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Journal of Non-Crystalline Solids

Volumn 356, Issue 25-27, 2010, Pages 1258-1261

Optical and AFM study of ion-synthesised silver nanoparticles in thin surface layers of SiO2 glass

(4) Popok, V N a Gromov, A V b Nuzhdin, V I c Stepanov, A L c,d

a UNIVERSITY OF GOTHENBURG (Sweden)

b UNIVERSITY OF EDINBURGH (United Kingdom)

c ZAVOISKY PHYSICAL TECHNICAL INSTITUTE (Russian Federation)

d LASER ZENTRUM HANNOVER E V (Germany)

Author keywords

Atomic force microscopy; Ion implantation; Metal glass nanocomposite; Optical spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; ION IMPLANTATION; IONS; METAL NANOPARTICLES; NANOPARTICLES; PLASMONS; SURFACE PLASMON RESONANCE;

ABSORPTION MAXIMA; NANOPARTICLE SIZES; OPTICAL SPECTROSCOPY; POSSIBLE MECHANISMS; POSTIMPLANTATION ANNEALING; SILVER NANOPARTICLES; SPECIFIC ABSORPTION; THIN SURFACE LAYER;

SILVER;

EID: 77956394561 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2010.04.038 Document Type: Article

Times cited : (21)

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