Ultrafast processes in highly excited wide-gap dielectric thin films

Femtosecond Laser Spectroscopy

Volumn , Issue , 2005, Pages 305-329

  Mero, M ^a   Zeller, J ^a   Rudolph, W ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

dielectric breakdown; dielectric thin films; Femtosecond laser spectroscopy; multiphoton ionization; optical damage

Indexed keywords

EID: 84889954214     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/0-387-23294-X_11     Document Type: Chapter

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