SCOPUS 정보 검색 플랫폼

Journal of Electronic Materials

Volumn 39, Issue 9, 2010, Pages 2013-2016

Fabrication and characterization of nanopillars for silicon-based thermoelectrics

(5) Stranz, A a Sokmen U a Wehmann, H H a Waag, A a Peiner, E a

a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG (Germany)

Author keywords

Nanopillars; silicon; thermoelectrics

Indexed keywords

LATERAL STRUCTURING; NANOMANIPULATORS; NANOPILLARS; PIEZO-RESISTIVE; SCANNING ELECTRON MICROSCOPES; SI-BASED; SILICON CANTILEVER; SILICON-BASED; STRUCTURAL CHARACTERIZATION; THERMAL OXIDATION; THERMOELECTRICS; TUNGSTEN PROBES;

FABRICATION; PROBES; SCANNING ELECTRON MICROSCOPY; TUNGSTEN;

ASPECT RATIO;

EID: 77956229421 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-009-1015-9 Document Type: Article

Times cited : (7)

References (7)

1
- 33748263468
- CRC Boca Raton
- K. Matsubara and M. Matsuura, Thermoelectric Handbook-Macro to Nano (Boca Raton: CRC, 2006), pp. 52-1-52-11.
- (2006) Thermoelectric Handbook-Macro to Nano , pp. 521-5211
- Matsubara, K.¹ Matsuura, M.²

2
- 38049143961
- 1:CAS:528:DC%2BD1cXksVGnsg%3D%3D 10.1038/nature06381 2008Natur.451.163H 18185582
- A Hochbaum R Chen R Diaz Delgado W Liang EC Garnett M Najarian A Majumdar P Yang 2008 Nature 451 163 1:CAS:528:DC%2BD1cXksVGnsg%3D%3D 10.1038/nature06381 2008Natur.451..163H 18185582
- (2008) Nature , vol.451 , pp. 163
- Hochbaum, A.¹ Chen, R.² Diaz Delgado, R.³ Liang, W.⁴ Garnett, E.C.⁵ Najarian, M.⁶ Majumdar, A.⁷ Yang, P.⁸

3
- 38049148246
- 1:CAS:528:DC%2BD1cXksVGgtg%3D%3D 10.1038/nature06458 2008Natur.451.168B 18185583
- AI Boukai Y Bunimovich J Tahir-Kheli J-K Yu WA Goddard III JR Heath 2008 Nature 451 168 1:CAS:528:DC%2BD1cXksVGgtg%3D%3D 10.1038/nature06458 2008Natur.451..168B 18185583
- (2008) Nature , vol.451 , pp. 168
- Boukai, A.I.¹ Bunimovich, Y.² Tahir-Kheli, J.³ Yu, J.-K.⁴ Goddard Iii, W.A.⁵ Heath, J.R.⁶

4
- 69949132455
- Ü. Sökmen, M. Balke, A. Stranz, S. FÜndling, E. Peiner, H.-H. Wehmann, and A. Waag, Proceedings of SPIE Conference, 7362 (2009).
- (2009) Proceedings of SPIE Conference , pp. 7362
- Ü. Sökmen¹

5
- 70350647602
- 10.1088/0960-1317/19/10/105005
- Ü Sökmen A Stranz S Fündling H-H Wehmann V Bandalo A Bora M Tornow A Waag E Peiner 2009 J. Micromech. Microeng. 19 105005 10.1088/0960-1317/19/10/105005
- (2009) J. Micromech. Microeng. , vol.19 , pp. 105005
- Sökmen, Ü.¹ Stranz, A.² Fündling, S.³ Wehmann, H.-H.⁴ Bandalo, V.⁵ Bora, A.⁶ Tornow, M.⁷ Waag, A.⁸ Peiner, E.⁹

6
- 0023855615
- 10.1109/16.2412 1988ITED.35.25K
- D-B Kao JP McVittie WD Nix KC Saraswat 1988 Trans. Electron. Dev. 35-1 25 10.1109/16.2412 1988ITED...35...25K
- (1988) Trans. Electron. Dev. , vol.351 , pp. 25
- Kao, D.-B.¹ McVittie, J.P.² Nix, W.D.³ Saraswat, K.C.⁴

7
- 46749107164
- 10.1088/0957-0233/19/6/064001 2008MeScT.19f4001P
- E Peiner M Balke L Doering U Brand 2008 Meas. Sci. Technol. 19 064001 10.1088/0957-0233/19/6/064001 2008MeScT..19f4001P
- (2008) Meas. Sci. Technol. , vol.19 , pp. 064001
- Peiner, E.¹ Balke, M.² Doering, L.³ Brand, U.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.