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Volumn 39, Issue 9, 2010, Pages 1408-1412
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Electrical and structural real-time changes in thin thermoelectric (Bi 0.15Sb 0.85) 2Te 3 films by dynamic thermal treatment
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Author keywords
antimony telluride; bismuth telluride; magnetron sputtering; Thermoelectric properties; thin films
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Indexed keywords
A-THERMAL;
ANTIMONY TELLURIDE;
APPLICATION FIELDS;
BISMUTH TELLURIDE;
BROAD SPECTRUM;
DEPOSITED FILMS;
ELECTRICAL CONDUCTIVITY;
ENERGY DISPERSIVE X-RAY;
HALL COEFFICIENT;
IN-SITU;
P-TYPE;
PELTIER COOLERS;
POWER FACTORS;
POWER SUPPLY;
REAL TIME MEASUREMENTS;
REAL-TIME CHANGES;
RECENT TRENDS;
ROOM TEMPERATURE;
SEEBECK;
SENSOR SYSTEMS;
THERMAL TREATMENT;
THERMOELECTRIC PROPERTIES;
THERMOELECTRICS;
ANTIMONY;
BISMUTH;
ELECTRIC CONDUCTIVITY;
ELECTRIC POWER FACTOR;
ELECTRIC POWER SUPPLIES TO APPARATUS;
ELECTRIC POWER SYSTEMS;
HALL MOBILITY;
HEAT TREATMENT;
HEATING;
SCANNING ELECTRON MICROSCOPY;
TELLURIUM COMPOUNDS;
THERMOELECTRIC EQUIPMENT;
THIN FILMS;
TIME MEASUREMENT;
TRANSPORT PROPERTIES;
X RAY DIFFRACTION ANALYSIS;
GALVANOMAGNETIC EFFECTS;
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EID: 77956228052
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-010-1325-y Document Type: Article |
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Times cited : (7)
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References (11)
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