Transmission electron microscope study of screen-printed Ag contacts on crystalline Si solar cells

Journal of the Electrochemical Society

Volumn 157, Issue 10, 2010, Pages

  Jeong, Myung Il ^a   Park, Sung Eun ^b   Kim, Dong Hwan ^b   Lee, Joon Sung ^c   Park, Yun Chang ^d   Ahn, Kwang Soon ^e   Choi, Chel Jong ^a  

^a Chonbuk National University   (South Korea)

^b Korea University   (South Korea)

^c Hyundai Heavy Industries   (South Korea)

^d National Nano Fab Center (NNFC)   (South Korea)

^e Yeungnam University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AG CONTACTS; AG THICK FILM; ATOMIC PLANES; CRYSTALLINE SI; EMITTER SURFACES; EPITAXIAL SUPERLATTICE; EPITAXIALLY GROWN; GLASS LAYERS; INTERFACE REGIONS; MATCHING CONDITION; MICRO-STRUCTURAL; RANDOMLY DISTRIBUTED; SCREEN-PRINTED; SI SURFACES; TEXTURED SI; TRANSMISSION ELECTRON MICROSCOPE;

CHEMICAL PROPERTIES; CRYSTALLINE MATERIALS; ELECTRIC ARCS; ELECTRON MICROSCOPES; FAST FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE MISMATCH; LEAD; SILICON; SILICON SOLAR CELLS; SOLAR CELLS; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY;

SILVER;

EID: 77956202433     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3473812     Document Type: Article

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