Clarification of high density electronic excitation effects on the microstructural evolution in UO2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 19, 2010, Pages 3277-3281

  Sonoda, T ^a   Kinoshita, M ^a   Ishikawa, N ^b   Sataka, M ^b   Iwase, A ^c   Yasunaga, K ^d  

^a CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c Osaka Prefecture University   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

Electronic excitation; Ion irradiation; Ion track; Rim structure; UO2

Indexed keywords

ELECTRONIC EXCITATION; ION IRRADIATION; ION TRACK; RIM STRUCTURE; UO2;

DEFECTS; ELECTRON MICROSCOPES; IRRADIATION; MICROSTRUCTURAL EVOLUTION; NANOELECTRONICS; POINT DEFECTS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; XENON; ZIRCONIUM;

IONS;

EID: 77956179727     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.06.015     Document Type: Conference Paper

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