Electron energy-dependent formation of dislocation loops in CeO2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 12-13, 2008, Pages 2877-2881

  Yasunaga, K ^a   Yasuda, K ^a   Matsumura, S ^a   Sonoda, T ^b  

^a KYUSHU UNIVERSITY   (Japan)

^b CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

Author keywords

Cerium dioxide (CeO2); Dislocation loops; Fluorite structure; High voltage electron microscopy (HVEM); Migration energy; Point defects

Indexed keywords

ELECTRON ENERGY ANALYZERS; ELECTRON IRRADIATION; POINT DEFECTS; TRANSMISSION ELECTRON MICROSCOPY;

DISLOCATION LOOPS; HIGH-VOLTAGE ELECTRON MICROSCOPY (HVEM); MIGRATION ENERGY;

CERIUM COMPOUNDS;

EID: 44649089317     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.204     Document Type: Article

References (7)

1. Inaba H., and Tagawa H. Solid State Ionics 83 (1996) 1
2. Yasunaga K., Yasuda K., Matsumura S., and Sonoda T. Nucl. Instr. and Meth. B 250 (2006) 114
3. L.W. Hobbs, J. Physique 37 C7-3.
4. Soullard J. J. Nucl. Mater. 78 (1978) 125
5. Kinoshita C., Hayashi K., and Kitajima S. Nucl. Instr. and Meth. B 1 (1984) 209
6. Kiritani M., Yoshida N., Tanaka H., and Maehara Y. J. Phys. Soc. Jpn. 38 (1975) 1677
7. Phillipp F., Saile B., and Urban K. Point Defects and Defect Interaction in Metals (1982), North-Holland Publishing Company, Amsterdam p. 261