Clarification of the properties and accumulation effects of ion tracks in CeO2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 12-13, 2008, Pages 2882-2886

  Sonoda, T ^a   Kinoshita, M ^a   Ishikawa, N ^b   Sataka, M ^b   Chimi, Y ^b   Okubo, N ^b   Iwase, A ^c   Yasunaga, K ^d  

^a CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c Osaka Prefecture University   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

61.80.Jh; 61.82.Ms; 68.37.Hk; 68.37.LP; CeO2; Electronic excitation; Ion irradiation; Ion track; Rim structure

Indexed keywords

ELECTRIC EXCITATION; ION BOMBARDMENT; MICROSTRUCTURAL EVOLUTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; XENON;

CROSS-SECTIONAL OBSERVATION; ION TRACKS; IRRADIATION TEMPERATURE; RIM STRUCTURE;

CERIUM COMPOUNDS;

EID: 44649184574     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.214     Document Type: Article

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