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Volumn 17, Issue 3, 2010, Pages 283-288
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Hydrogenated amorphous/nanocrystalline silicon thin films on porous anodic alumina substrate
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Author keywords
chemical vapor deposition; Hydrogenated amorphous silicon; porous anodic alumina; Raman spectra; textured surfaces; X ray diffraction
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Indexed keywords
AMORPHOUS AND NANOCRYSTALLINE SILICON;
CRYSTALLINITIES;
ELECTRON CYCLOTRON RESONANCE-CHEMICAL VAPOR DEPOSITIONS;
GAS COMPOSITIONS;
GROWTH PROCESS;
HYDROGENATED AMORPHOUS SILICON;
HYDROGENATED SILICON;
NANOCRYSTALLINE PHASIS;
POROUS ANODIC ALUMINA;
RAMAN SPECTRA;
SILICON PHASIS;
SILICON THIN FILM;
STRUCTURAL CHARACTERIZATION;
TEXTURED SUBSTRATES;
TEXTURED SURFACE;
X-RAY DIFFRACTION STUDIES;
ALUMINUM SHEET;
AMORPHOUS FILMS;
ARGON;
CHEMICAL VAPOR DEPOSITION;
CYCLOTRONS;
DEPOSITION;
DIFFRACTION;
HYDROGENATION;
NANOCRYSTALLINE SILICON;
POROUS SILICON;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SUBSTRATES;
SURFACE STRUCTURE;
THIN FILMS;
X RAY DIFFRACTION;
X RAYS;
AMORPHOUS SILICON;
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EID: 77956077366
PISSN: 0218625X
EISSN: None
Source Type: Journal
DOI: 10.1142/S0218625X10013679 Document Type: Article |
Times cited : (4)
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References (19)
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