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Volumn 93, Issue 6-7, 2009, Pages 674-679

Light induced degradation in nanocrystalline Si films and related solar cells: Role of crystalline fraction

Author keywords

Light induced degradation of photoconductivity; Nanocrystalline silicon; Protocrystalline silicon; Solar cell

Indexed keywords

ABSORBER LAYERS; CRYSTALLINE FRACTIONS; CRYSTALLINE VOLUME FRACTIONS; GRAIN SIZES; INITIAL EFFICIENCIES; LIGHT-INDUCED DEGRADATION OF PHOTOCONDUCTIVITY; LIGHT-SOAKING; NANO-CRYSTALLINE SI; NANOCRYSTALLINE SI FILMS; NANOCRYSTALLINE SOLAR CELLS; PRESSURE CONDITIONS; PROTOCRYSTALLINE; PROTOCRYSTALLINE SILICON; SILICON THIN FILMS; SINGLE-JUNCTION SOLAR CELLS; SOLAR CELL EFFICIENCIES; STABILIZED EFFICIENCIES;

EID: 67349242724     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.03.008     Document Type: Article
Times cited : (14)

References (7)
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  • 2
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    • Light-soaking stability of silicon thin film solar cells using alternately hydrogenated dilution method
    • Ito M., Shimizu S., Kondo M., and Matsuda A. Light-soaking stability of silicon thin film solar cells using alternately hydrogenated dilution method. J. Non-Cryst. Solids 338-340 (2004) 698
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  • 3
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    • Study of medium-range order and defects in hydrogenated protocrystalline silicon films deposited by radio frequency plasma enhanced chemical vapor deposition
    • Goswami R., and Ray S. Study of medium-range order and defects in hydrogenated protocrystalline silicon films deposited by radio frequency plasma enhanced chemical vapor deposition. Jpn. J. Appl. Phys. 46 (2007) 7188
    • (2007) Jpn. J. Appl. Phys. , vol.46 , pp. 7188
    • Goswami, R.1    Ray, S.2
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    • Structural, defect, and device behavior of hydrogenated amorphous Si near and above the onset of microcrystallinity
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    • Guha, S.1    Yang, J.2    Williamson, D.L.3    Lubianiker, Y.4    Cohen, J.D.5    Mahan, A.H.6
  • 6
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    • Structural analysis of undoped microcrystalline silicon thin films deposited by PECVD technique
    • Mukhopadhyay S., Das C., and Ray S. Structural analysis of undoped microcrystalline silicon thin films deposited by PECVD technique. J. Phys. D: Appl. Phys. 37 (2004) 1736
    • (2004) J. Phys. D: Appl. Phys. , vol.37 , pp. 1736
    • Mukhopadhyay, S.1    Das, C.2    Ray, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.