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Volumn 518, Issue 22, 2010, Pages 6285-6288
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Structural, optical, and electrical properties of AZO films by tilted angle sputtering method
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Author keywords
Aluminum doped zinc oxide; Optical and electrical characteristics; RF magnetron sputtering; Structural property; Tilted angle sputtering
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Indexed keywords
ALUMINUM-DOPED ZINC OXIDE;
AZO FILMS;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL PROPERTY;
EXTINCTION COEFFICIENTS;
GLASS SUBSTRATES;
NANO-COLUMNS;
OPTICAL TRANSMITTANCE;
RF-MAGNETRON SPUTTERING;
SI SUBSTRATES;
SPUTTERING METHODS;
SPUTTERING PROCESS;
SUBSTRATE HOLDERS;
SUBSTRATE ROTATION;
TILTED ANGLE;
VISIBLE-WAVELENGTH RANGE;
ALUMINUM;
ELECTRIC PROPERTIES;
MAGNETRON SPUTTERING;
OXIDE FILMS;
REFRACTIVE INDEX;
STRUCTURAL PROPERTIES;
SUBSTRATES;
ZINC;
ZINC OXIDE;
OPTICAL FILMS;
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EID: 77956059819
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2010.02.075 Document Type: Conference Paper |
Times cited : (24)
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References (18)
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