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Volumn 97, Issue 7, 2010, Pages

Tailoring point electron sources of individual carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

AREA MEASUREMENT; EDGE LITHOGRAPHY; ELECTRON FIELD EMITTER; FIELD ENHANCEMENT FACTOR; FOWLER-NORDHEIM LAW; I - V CURVE; LOW OPERATING VOLTAGE; METAL CONTACTS; NANOTUBE EMITTERS; ORDER OF MAGNITUDE; POINT-ELECTRON SOURCE; SILICON SUBSTRATES;

EID: 77956031019     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3481690     Document Type: Article
Times cited : (3)

References (17)
  • 13
    • 35949027881 scopus 로고
    • RMPHAT 0034-6861. 10.1103/RevModPhys.45.487
    • J. W. Gadzuk and E. W. Plummer, Rev. Mod. Phys. RMPHAT 0034-6861 45, 487 (1973). 10.1103/RevModPhys.45.487
    • (1973) Rev. Mod. Phys. , vol.45 , pp. 487
    • Gadzuk, J.W.1    Plummer, E.W.2
  • 16
    • 14344251726 scopus 로고    scopus 로고
    • PLRBAQ 0556-2805. 10.1103/PhysRevB.65.075418
    • C. Adessi and M. Devel, Phys. Rev. B PLRBAQ 0556-2805 65, 075418 (2002). 10.1103/PhysRevB.65.075418
    • (2002) Phys. Rev. B , vol.65 , pp. 075418
    • Adessi, C.1    Devel, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.