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Volumn , Issue , 2009, Pages 920-924

No Fault Found events during the operational life of military aircraft items

Author keywords

Aircraft; Military; No Fault Found (NFF); Operational life; Sweden

Indexed keywords

CONDITION MAINTENANCE; DESIGN AND TESTS; MILITARY; NO FAULT FOUND; OPERATIONAL DATA; OPERATIONAL LIFE; OPERATIONAL MODES; REPAIRABLE ITEMS; SWEDEN;

EID: 77955961169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICRMS.2009.5269968     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 2
    • 0033353446 scopus 로고    scopus 로고
    • New trends in aircraft reliability and maintenance measures
    • D.U. Kumar, "New trends in aircraft reliability and maintenance measures," Journal of Quality in Maintenance Engineering, 1999, Vol.5, No.4, pp. 287-295.
    • (1999) Journal of Quality in Maintenance Engineering , vol.5 , Issue.4 , pp. 287-295
    • Kumar, D.U.1
  • 3
    • 84879382293 scopus 로고    scopus 로고
    • Reducing the 'no fault found' problem: Contributions from expert-system methods
    • Big Sky, MT, USA
    • I. Beniaminy, D. Joseph,. "Reducing the 'no fault found' problem: contributions from expert-system methods," Proceedings of the IEEE Aerospace Conference, Big Sky, MT, USA, 2002, pp. 6-2971-6-2973.
    • (2002) Proceedings of the IEEE Aerospace Conference , pp. 62971-62973
    • Beniaminy, I.1    Joseph, D.2
  • 4
    • 33748329462 scopus 로고    scopus 로고
    • A system view of the No Fault Found (NFF) phenomenon
    • P. Söderholm, "A system view of the No Fault Found (NFF) phenomenon," Reliability Engineering and System Safety, 2007, Vol.92, No., pp. 1-14.
    • (2007) Reliability Engineering and System Safety , vol.92 , pp. 1-14
    • Söderholm, P.1
  • 7
    • 0035466288 scopus 로고    scopus 로고
    • Investigation of the occurrence of no-faults-found in electronics
    • J. Jones, J. Hayes, "Investigation of the occurrence of no-faults-found in electronics," IEEE Transactions on Reliability, 2001, Vol. 50, No. 3, pp. 289-292.
    • (2001) IEEE Transactions on Reliability , vol.50 , Issue.3 , pp. 289-292
    • Jones, J.1    Hayes, J.2
  • 9
    • 0036446376 scopus 로고    scopus 로고
    • Reducing no fault found using statistical processing and an expert system
    • Huntsville, AL, USA
    • B. Steadman, T. Pombo, J. Shively, and L. Kirkland, "Reducing No Fault Found using statistical processing and an expert system," Proceedings of AUTOTESTCON, Huntsville, AL, USA, 2002, pp. 872-879.
    • (2002) Proceedings of AUTOTESTCON , pp. 872-879
    • Steadman, B.1    Pombo, T.2    Shively, J.3    Kirkland, L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.