Simulated effects of proton and ion beam irradiation on titanium dioxide memristors

IEEE Transactions on Nuclear Science

Volumn 57, Issue 4 PART 1, 2010, Pages 1798-1804

  Vujisic, Milos ^a   Stankovic, Koviljka ^a   Marjanovic, Nada ^a   Osmokrovic, Predrag ^a  

^a School of Electrical Engineering   (Serbia)

Author keywords

Ions; Memristor; Monte Carlo method; protons; titanium dioxide

Indexed keywords

ELECTRONIC CONDUCTION; ION BEAM IRRADIATION; MEMRISTOR; PARTICLE TRANSPORT; RADIATION-INDUCED; STATE-RETENTION;

ION BEAMS; IONS; OXIDES; OXYGEN; PROTONS; TITANIUM; TITANIUM DIOXIDE; VACANCIES;

MONTE CARLO METHODS;

EID: 77955822780     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2045512     Document Type: Conference Paper

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