SCOPUS 정보 검색 플랫폼

Journal of Analytical Atomic Spectrometry

Volumn 25, Issue 9, 2010, Pages 1461-1466

Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

(4) Pohl, Pawel a,b Vorapalawut, Nopparat a,c Bouyssiere, Brice a Lobinski, Ryszard a,d

a CNRS (France)

b WROCLAW UNIVERSITY OF TECHNOLOGY (Poland)

c Mahidol University ^* (Thailand)

d WARSAW UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION GRAPHS; CHEMICAL FORMS; DETECTION LIMITS; DOUBLE FOCUSING; FLOW INJECTION; HIGH-RESOLUTION ICP-MS; MAGNETIC SECTORS; MICRO-FLOW; NORMAL PHASE HPLC; ORDERS OF MAGNITUDE; ORGANIC SOLUTIONS; RELATED MATRICES; SAMPLE DILUTION; SAMPLE INTRODUCTION; SAMPLE MATRIX; SIGNAL-TO-BACKGROUND RATIO; SPRAY CHAMBER; STANDARD SAMPLES; TRACE-LEVEL DETERMINATION;

TRACE ANALYSIS;

SILICON COMPOUNDS;

EID: 77955810479 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c005010e Document Type: Conference Paper

Times cited : (25)

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