Determination of Si in standard reference material SRM 295x silica-on-filter

Journal of Analytical Atomic Spectrometry

Volumn 18, Issue 7, 2003, Pages 738-741

  Yu, Lee L ^a   Fassett, John D ^a   Lindstrom, Abigail P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAVIMETRIC ANALYSIS; HEALTH CARE; LAWS AND LEGISLATION; MASS SPECTROMETRY; STANDARDS;

GRAVIMETRIC DELIVERY; HIGH-RESOLUTION INDUCTIVELY COUPLED PLASMA; INSTRUMENT CALIBRATION; MASS SPECTROMETRIC METHOD; OCCUPATIONAL HAZARD; STANDARD REFERENCE MATERIALS;

SILICA;

EID: 0041848213     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b212069k     Document Type: Article

References (12)

1. NIOSH Hazard Review: Health Effects of Occupational Exposure to Respirable Crystalline Silica, DHHS (NIOSH) Publication No. 2002-129, April, 2002.
2. NIOSH Manual of Analytical Methods (NMAM®), ed. M. E. Cassinelli and P. F. O'Conner, DHHS (NIOSH) Publication 94-113, 4th edn., August, 1994.
3. P. M. Eller, H. A. Feng, R. S. Song, R. J. Key-Schwartz, C. A. Esche and J. H. Groff, Am. Ind. Hyg. Assoc. J., 1999, 60, 533.
4. P. K. Klemens and K. G. Heumann, Frescnius J. Anal. Chem., 2001, 371, 758.
5. A. P. Krushevska and R. M. Barnes, J. Anal. At. Spectrom., 1994, 9, 981.
6. D. Wiederin and A. Cutierrez, in Investigation of Sources of Background for Ultratrace Silicon Analysis using HR-ICPMS, FACSS'01 Detroit, MI.
7. L. A. Derry, R. S. Houk and R. Franks, Element Electronic Bulletin Board, 'element@cats.ucsc.edu' R. Franks adm., Aug., 2002.
8. J. P. McConnell, T. P. Moyer, D. E. Nixon, P. L. Schnur, D. R. Salomao, T. B. Crotty, J. Weinzeig, J. B. Harris and P. M. Petty, Anatom. Pathol., 1997, 107, 236.
9. Y. Han, H. M. Kingston, R. C. Richter and C. Pirola, Anal. Chem., 2001, 73, 1106.
10. R. T. Sanderson, Chemical Periodicity, Reinhold, New York, 1960.
11. W. May, R. Parris, C. Beck, J. Fassen, R. Greenberg, F. Guenther, G. Kramer, S. Wise, T. Gills, J. Colbert, R. Gettings, B. MacDonald, Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurements, NIST Special Publication 260-136, January 2000, US Government Printing Office, Washington DC.
12. J. Burwell, Z. Xu, E. Ransford and T. C. Rains, High Purity Standards Report of Analysis, July 2002.