-
1
-
-
33645527344
-
-
PRLTAO 0031-9007,. 10.1103/PhysRevLett.96.125505
-
R. E. Jones, K. M. Yu, S. X. Li, W. Walukiewicz, J. W. Ager, E. E. Haller, H. Lu, and W. J. Schaff, Phys. Rev. Lett. PRLTAO 0031-9007 96, 125505 (2006). 10.1103/PhysRevLett.96.125505
-
(2006)
Phys. Rev. Lett.
, vol.96
, pp. 125505
-
-
Jones, R.E.1
Yu, K.M.2
Li, S.X.3
Walukiewicz, W.4
Ager, J.W.5
Haller, E.E.6
Lu, H.7
Schaff, W.J.8
-
2
-
-
71949129363
-
-
APPLAB 0003-6951,. 10.1063/1.3270042
-
H. Ahn, Y. -J. Yeh, Y. -L. Hong, and S. Gwo, Appl. Phys. Lett. APPLAB 0003-6951 95, 232104 (2009). 10.1063/1.3270042
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 232104
-
-
Ahn, H.1
Yeh, Y.-J.2
Hong, Y.-L.3
Gwo, S.4
-
3
-
-
33646243837
-
Terahertz radiation from InAs induced by carrier diffusion and drift
-
DOI 10.1103/PhysRevB.73.155330
-
K. Liu, J. Xu, T. Yuan, and X. -C. Zhang, Phys. Rev. B PLRBAQ 0556-2805 73, 155330 (2006). 10.1103/PhysRevB.73.155330 (Pubitemid 43659857)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.73
, Issue.15
, pp. 155330
-
-
Liu, K.1
Xu, J.2
Yuan, T.3
Zhang, X.-C.4
-
4
-
-
27844447281
-
Hole transport and carrier lifetime in InN epilayers
-
DOI 10.1063/1.2133892, 212104
-
F. Chen, A. N. Cartwright, H. Lu, and W. J. Schaff, Appl. Phys. Lett. APPLAB 0003-6951 87, 212104 (2005). 10.1063/1.2133892 (Pubitemid 41643361)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.21
, pp. 1-3
-
-
Chen, F.1
Cartwright, A.N.2
Lu, H.3
Schaff, W.J.4
-
5
-
-
4043096846
-
-
SSTEET 0268-1242,. 10.1088/0268-1242/19/8/013
-
D. Zanato, N. Balkan, B. K. Ridley, G. Hill, and W. J. Schaff, Semicond. Sci. Technol. SSTEET 0268-1242 19, 1024 (2004). 10.1088/0268-1242/19/8/013
-
(2004)
Semicond. Sci. Technol.
, vol.19
, pp. 1024
-
-
Zanato, D.1
Balkan, N.2
Ridley, B.K.3
Hill, G.4
Schaff, W.J.5
-
6
-
-
20844457733
-
Phonon lifetimes and phonon decay in InN
-
DOI 10.1063/1.1940124, 223501
-
J. W. Pomeroy, M. Kuball, H. Lu, W. J. Schaff, X. Wang, and A. Yoshikawa, Appl. Phys. Lett. APPLAB 0003-6951 86, 223501 (2005). 10.1063/1.1940124 (Pubitemid 40861629)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.22
, pp. 1-3
-
-
Pomeroy, J.W.1
Kuball, M.2
Lu, H.3
Schaff, W.J.4
Wang, X.5
Yoshikawa, A.6
-
7
-
-
65449171691
-
-
JCOMEL 0953-8984,. 10.1088/0953-8984/19/23/236219
-
K. T. Tsen, J. G. Kiang, D. K. Ferry, H. Lu, W. J. Schaff, H. -W. Lin, and S. Gwo, J. Phys.: Condens. Matter JCOMEL 0953-8984 19, 236219 (2007). 10.1088/0953-8984/19/23/236219
-
(2007)
J. Phys.: Condens. Matter
, vol.19
, pp. 236219
-
-
Tsen, K.T.1
Kiang, J.G.2
Ferry, D.K.3
Lu, H.4
Schaff, W.J.5
Lin, H.-W.6
Gwo, S.7
-
8
-
-
34547302357
-
Ultrafast hot electron relaxation time anomaly in InN epitaxial films
-
DOI 10.1063/1.2751110
-
T. -R. Tsai, C. -F. Chang, and S. Gwo, Appl. Phys. Lett. APPLAB 0003-6951 90, 252111 (2007). 10.1063/1.2751110 (Pubitemid 47141210)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.25
, pp. 252111
-
-
Tsai, T.-R.1
Chang, C.-F.2
Gwo, S.3
-
9
-
-
46449120320
-
-
JAPIAU 0021-8979,. 10.1063/1.2940737
-
S. -Z. Sun, Y. -C. Wen, S. -H. Guo, H. -M. Lee, S. Gwo, and C. -K. Sun, J. Appl. Phys. JAPIAU 0021-8979 103, 123513 (2008). 10.1063/1.2940737
-
(2008)
J. Appl. Phys.
, vol.103
, pp. 123513
-
-
Sun, S.-Z.1
Wen, Y.-C.2
Guo, S.-H.3
Lee, H.-M.4
Gwo, S.5
Sun, C.-K.6
-
10
-
-
33645143836
-
-
APPLAB 0003-6951,. 10.1063/1.2185407
-
R. Ascázubi, I. Wilke, S. Cho, H. Lu, and W. J. Schaff, Appl. Phys. Lett. APPLAB 0003-6951 88, 112111 (2006). 10.1063/1.2185407
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 112111
-
-
Ascázubi, R.1
Wilke, I.2
Cho, S.3
Lu, H.4
Schaff, W.J.5
-
11
-
-
70350413252
-
-
APPLAB 0003-6951,. 10.1063/1.3251077
-
S. Nargelas, R. Alecksiejunas, M. Vengris, T. Malinauskas, K. Jarasiunas, and E. Dimakis, Appl. Phys. Lett. APPLAB 0003-6951 95, 162103 (2009). 10.1063/1.3251077
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 162103
-
-
Nargelas, S.1
Alecksiejunas, R.2
Vengris, M.3
Malinauskas, T.4
Jarasiunas, K.5
Dimakis, E.6
-
12
-
-
71949119992
-
-
APPLAB 0003-6951,. 10.1063/1.3272916
-
K. Fukunaga, M. Hashimoto, H. Kunugita, J. Kamimura, A. Kikuchi, K. Kishino, and K. Ema, Appl. Phys. Lett. APPLAB 0003-6951 95, 232114 (2009). 10.1063/1.3272916
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 232114
-
-
Fukunaga, K.1
Hashimoto, M.2
Kunugita, H.3
Kamimura, J.4
Kikuchi, A.5
Kishino, K.6
Ema, K.7
-
13
-
-
60749124999
-
-
APPLAB 0003-6951,. 10.1063/1.3086888
-
Y. -M. Chang and S. Gwo, Appl. Phys. Lett. APPLAB 0003-6951 94, 071911 (2009). 10.1063/1.3086888
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 071911
-
-
Chang, Y.-M.1
Gwo, S.2
-
14
-
-
58149333206
-
-
ZZZZZZ 1931-7573,. 10.1007/s11671-008-9211-8
-
A. Othonos, M. Zervos, and M. Pervolaraki, Nanoscale Res. Lett. ZZZZZZ 1931-7573 4, 122 (2009). 10.1007/s11671-008-9211-8
-
(2009)
Nanoscale Res. Lett.
, vol.4
, pp. 122
-
-
Othonos, A.1
Zervos, M.2
Pervolaraki, M.3
-
15
-
-
35548950284
-
Terahertz spectroscopic study of vertically aligned InN nanorods
-
DOI 10.1063/1.2800292
-
H. Ahn, Y. -P. Ku, C. -H. Chuang, C. -L. Pan, H. -W. Lin, Y. -L. Hong, and S. Gwo, Appl. Phys. Lett. APPLAB 0003-6951 91, 163105 (2007). 10.1063/1.2800292 (Pubitemid 350004054)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.16
, pp. 163105
-
-
Ahn, H.1
Ku, Y.-P.2
Wang, Y.-C.3
Chuang, C.-H.4
Gwo, S.5
Pan, C.-L.6
-
16
-
-
20844462397
-
Spectroscopic ellipsometry study of wurtzite InN epitaxial films on Si(111) with varied carrier concentrations
-
DOI 10.1063/1.1929097, 201905
-
H. Ahn, C. -H. Shen, C. -L. Wu, and S. Gwo, Appl. Phys. Lett. APPLAB 0003-6951 86, 201905 (2005). 10.1063/1.1929097 (Pubitemid 40860995)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.20
, pp. 1-3
-
-
Ahn, H.1
Shen, C.-H.2
Wu, C.-L.3
Gwo, S.4
|