Ion beam induced deposition of platinum carbon composite electrodes for combined atomic force microscopy-scanning electrochemical microscopy

Electrochemistry Communications

Volumn 12, Issue 7, 2010, Pages 989-991

  Wiedemair, Justyna ^a   Moon, Jong Seok ^a   Reinauer, Felix ^b   Mizaikoff, Boris ^c   Kranz, Christine ^c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b Ametek   (United States)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

Atomic force microscopy; Focused ion beam; Hyphenated scanning probe techniques; Ion beam induced deposition; Scanning electrochemical microscopy

Indexed keywords

AFM; AFM TIP; ANALYTES; CARBON COMPOSITES; CARBON CONTENT; COMPOSITE ELECTRODE; ELECTROACTIVE-AREA; FOCUSED ION BEAM MILLING; GEOMETRIC DIMENSIONS; HYPHENATED SCANNING PROBE TECHNIQUES; ION BEAM INDUCED DEPOSITION; MICROFABRICATED; POTASSIUM HEXACYANOFERRATE; SCANNING ELECTROCHEMICAL MICROSCOPY;

ATOMIC FORCE MICROSCOPY; ATOMS; BEAM PLASMA INTERACTIONS; BIOSENSORS; CARBON CARBON COMPOSITES; ELECTROCHEMICAL ELECTRODES; FOCUSED ION BEAMS; HYDROGEN PEROXIDE; INTERMETALLICS; ION BOMBARDMENT; IONS; OXIDATION; PLATINUM; PLATINUM COMPOUNDS; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY;

ANALYTIC EQUIPMENT;

EID: 77955663409     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2010.05.008     Document Type: Article

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