Optical and structural studies on Ba(Mg 1/3 Ta 2/3 ) O 3 thin films obtained by radiofrequency assisted pulsed plasma deposition

Applied Surface Science

Volumn 256, Issue 22, 2010, Pages 6526-6530

  Scarisoreanu, N D ^a   Galca, A C ^b   Nedelcu, L ^b   Ioachim, A ^b   Toacsan, M I ^b   Morintale, E ^c   Stoica, S D ^a   Dinescu, M ^a  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^c UNIVERSITY OF CRAIOVA   (Romania)

Author keywords

BMT; Ellipsometry; RF PLD; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; BEAM PLASMA INTERACTIONS; ELLIPSOMETRY; ENERGY GAP; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SOLID STATE REACTIONS; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; X RAY DIFFRACTION;

BAND-TO-BAND TRANSITION; PULSED PLASMA DEPOSITION; RADIOFREQUENCY PLASMA BEAMS; STRUCTURAL AND OPTICAL CHARACTERIZATIONS; STRUCTURAL STUDIES; THIN FILMS DEPOSITION; TRANSMISSION SPECTRUMS; X-RAY DIFFRACTION SPECTRUM;

THIN FILMS;

EID: 77955658628     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.04.041     Document Type: Article

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