Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 349-353

  Fried, M ^a   Petrik, P ^a   Horvath Z E ^a   Lohner, T ^a   Schmidt, C ^b   Schneider, C ^b   Ryssel, H ^b,c  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b FRAUNHOFER INSTITUTE FOR INTEGRATED SYSTEMS AND DEVICE TECHNOLOGY IISB   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Ferroelectric materials; Grain size; Spectroscopic ellipsometry; X ray diffraction

Indexed keywords

ELLIPSOMETRY; FERROELECTRIC MATERIALS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; X RAY DIFFRACTION;

ADACHI MODEL; OPTICAL PARAMETERS; SPECTROSCOPIC ELLIPSOMETRY; STRONTIUM-BISMUTH-TANTALATE (SBT);

THIN FILMS;

EID: 33750499296     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.06.009     Document Type: Article

References (5)

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