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Journal of Materials Science: Materials in Electronics

Volumn 21, Issue 7, 2010, Pages 698-701

Structural, optical and microscopic properties of chemically deposited Mo 0.5W 0.5Se 2 thin films

(4) Hankare, P P a Manikshete, A H b Sathe, D J c Chate, P A d

a SHIVAJI UNIVERSITY (India)

b Walchand College (India)

c KIT's College of Engineering (India)

d JSM College (India)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP ENERGY; CHEMICAL ROUTES; DIRECT BAND GAP; HEXAGONAL PHASE; MICROSCOPIC PROPERTIES; OPTICAL AND ELECTRICAL PROPERTIES; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPE; SPECIFIC ELECTRICAL CONDUCTIVITY;

ELECTRIC CONDUCTIVITY; ENERGY GAP; HOLOGRAPHIC INTERFEROMETRY; MOLYBDENUM; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY MICROSCOPES;

COLOR FILMS;

EID: 77955581303 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-009-9980-6 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.