Novel chemical synthetic route and characterization of tungsten diselenide thin films

Materials Chemistry and Physics

Volumn 113, Issue 1, 2009, Pages 183-186

  Hankare, P P ^a   Manikshete, A H ^b   Sathe, D J ^c   Chate, P A ^d   Rathod, K C ^a  

^a SHIVAJI UNIVERSITY   (India)

^b Walchand College of Arts and Science   (India)

^c KIT's College of Engineering   (India)

^d JSM College   (India)

Author keywords

Chalcogenides; Crystal structure; Electronic material; Optical material; Thin films; X ray diffraction

Indexed keywords

ACIDS; CHALCOGENIDES; COLOR FILMS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRIC CONDUCTIVITY; ENERGY GAP; GALLIUM ALLOYS; HYDRATES; INORGANIC COMPOUNDS; MICROSCOPIC EXAMINATION; OPTICAL CONDUCTIVITY; OPTICAL MICROSCOPY; SELENIUM COMPOUNDS; SODIUM; SOLIDS; THICK FILMS; THIN FILMS; TUNGSTEN; TUNGSTEN COMPOUNDS; X RAY ANALYSIS; X RAY DIFFRACTION;

ALKALINE MEDIUMS; BAND GAPS; CHEMICAL BATH DEPOSITION METHODS; CONDUCTION MECHANISMS; DIRECT BAND GAPS; ELECTRICAL CONDUCTIVITIES; ELECTRONIC MATERIAL; HYDRAZINE HYDRATES; OPTICAL ABSORPTIONS; OPTICAL STUDIES; POLYCRYSTAL LINES; ROOM TEMPERATURES; SEMICONDUCTOR THIN FILMS; SODIUM SELENOSULPHATE; SODIUM TUNGSTATES; SYNTHETIC ROUTES; TARTARIC ACIDS; X-RAY DIFFRACTIONS;

OPTICAL FILMS;

EID: 56749180807     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.07.040     Document Type: Article

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