Preparation and characterization of nitrogen-incorporated SnO2 films

Applied Physics A: Materials Science and Processing

Volumn 85, Issue 1, 2006, Pages 21-24

  Pan, S S ^a   Ye, C ^a   Teng, X M ^a   Fan, H T ^a   Li, G H ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CHEMICAL BONDS; FILM GROWTH; NITROGEN; TIN COMPOUNDS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC BINDING; BAND GAPS; GAS MIXTURES; QUARTZ SUBSTRATES;

THIN FILMS;

EID: 33747479151     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3659-0     Document Type: Article

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