메뉴 건너뛰기




Volumn 518, Issue 21, 2010, Pages 6022-6029

Aqueous lateral epitaxy overgrowth of ZnO on (0001) GaN at 90 °c: Part I. Increasing the critical thickness

Author keywords

Cracking; Critical thickness; Lateral epitaxial overgrowth; Scanning electron microscopy; Solution deposition; Zinc oxide

Indexed keywords

AQUEOUS SOLUTIONS; CIRCULAR WINDOWS; CRITICAL THICKNESS; ELECTRICAL CHARACTERISTIC; GAN SUBSTRATE; GROWTH WINDOW; HALL EFFECT MEASUREMENT; HEXAGONAL ARRAYS; LATERAL EPITAXIAL OVERGROWTH; LATERAL EPITAXY; MICROPHOTOLUMINESCENCE; OPTICAL TRANSMISSIONS; OPTOELECTRONIC PROPERTIES; PHOTORESIST MASK; SOLUTION DEPOSITION; ZNO; ZNO THIN FILM;

EID: 77955557314     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.03.066     Document Type: Article
Times cited : (8)

References (27)
  • 21
    • 77955555115 scopus 로고    scopus 로고
    • Cambridge University Press S.
    • L.B. Freund, and S. Suresh 2003 Cambridge University Press
    • (2003)
    • Freund, L.B.1    Suresh, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.