Long-term stability of nanostructured systems with negative heats of mixing

Journal of Applied Physics

Volumn 101, Issue 10, 2007, Pages

  Nathani, H ^a   Wang, J ^b   Weihs, T P ^a  

^a Johns Hopkins University   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; DIFFERENTIAL SCANNING CALORIMETRY; EXOTHERMIC REACTIONS; SYSTEM STABILITY;

BILAYER THICKNESSES; BILAYERS; FORMATION REACTION; NANOLAMINATE FOILS; NANOSTRUCTURED SYSTEMS;

NANOSTRUCTURED MATERIALS;

EID: 34249913947     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2736937     Document Type: Article

References (17)

1. G. Binasch, P. Grünberg, F. Saurenbach, and W. Zinn, Phys. Rev. B 39, 4828 (1989).
2. S. S. P. Parkin, N. More, and K. P. Roche, Phys. Rev. Lett. 64, 2304 (1990).
3. M. Uhlemann, A. Gebert, M. Herrich, A. Krause, A. Cziraki, and L. Schultz, Electrochim. Acta 48, 3005 (2003).
4. J. H. Strickler and W. W. Webb, Proc. SPIE 1663, 104 (1992).
5. A. A. Voevodin, D. V. Shtansky, E. A. Levashov, and J. J. Moore, Nanostructured Thin Films and Nanodispersion Strengthened Coatings (Springer, Netherlands, 2004), pp. 69-76.
6. T. W. Barbee, MRS Bull. 15, 17 (1990).
7. A. V. Vinogradov, Quantum Electron. 32, 1113 (2002).
8. J. Wang, Appl. Phys. Lett. 83, 3987 (2003).
9. J. Wang, E. Besnoin, A. Duckham, S. J. Spey, M. E. Reiss, O. M. Knio, and T. P. Weihs, J. Appl. Phys. 95, 248 (2004).
10. A. Duckham, S. J. Spey, J. Wang, M. E. Reiss, T. P. Weihs, E. Besnoin, and O. M. Knio, J. Appl. Phys. 96, 2336 (2004).
11. A. J. Swiston, Jr., T. C. Hufnagel, and T. P. Weihs, Scr. Mater. 48, 1575 (2003).
12. A. J. Swiston, Jr., E. Besnoin, A. Duckham, O. M. Knio, T. P. Weihs, and T. C. Hufnagel, Acta Mater. 53, 3713 (2005).
13. T. P. Weihs, M. A. Wall, and T. W. Barbee, Jr., J. Mater. Res. 11, 1403 (1996).
14. C. Michaelsen, K. Barmak, and T. P. Weihs, J. Phys. D 30, 3167 (1997).
15. A. J. Gavens, D. Van Haeerden, A. B. Mann, M. E. Reiss, and T. P. Weihs, J. Appl. Phys. 87, 1255 (2000).
16. K. J. Blobaum, D. Van Heerden, A. J. Gavens, and T. P. Weihs, Acta Mater. 51, 3871 (2003).
17. P. Zhu, J. C. M. Li, and C. T. Liu, Mater. Sci. Eng., A 357, 248 (2003).