Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 1054-1058

  Hug, G ^a   Eklund, P ^a,b   Orchowski, A ^c  

^a Centre National de la Recherche Scientifique   (France)

^b LINKÖPING UNIVERSITY   (Sweden)

^c CARL ZEISS SMT AG   (Germany)

Author keywords

Anisotropy; Conductivity; Drude Lorentz model; EELS; Electronic structure; MAX phases; Nanolaminate

Indexed keywords

CONDUCTIVITY; DIELECTRIC FUNCTIONS; DRUDE-LORENTZ MODEL; EELS; ELECTRON ENERGY LOSS SPECTRUM; ELECTRON LIFETIME; INTER-BAND TRANSITION; LOW ENERGY REGIONS; MAX PHASIS; NANOLAMINATE; ORIENTATION DEPENDENCE; PLASMON RESONANCES; POLYCRYSTALLINE; STRONG ORIENTATION;

ANISOTROPY; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ELECTRONS; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; SILICON CARBIDE;

ELECTRON ENERGY LOSS SPECTROSCOPY;

TITANIUM;

AB INITIO CALCULATION; ANISOTROPY; ARTICLE; CRYSTAL; DIELECTRIC CONSTANT; ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON PROBE MICROANALYSIS; OSCILLATION; SURFACE PLASMON RESONANCE;

EID: 77955518114     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.05.007     Document Type: Article

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