Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC

Solid State Communications

Volumn 146, Issue 11-12, 2008, Pages 498-501

  Scabarozi, T H ^a,b   Eklund, P ^c   Emmerlich, J ^c   Hogberg H ^c   Meehan, T ^b   Finkel, P ^b   Barsoum, M W ^a   Hettinger, J D ^b   Hultman, L ^c   Lofland, S E ^b  

^a Drexel University   (United States)

^b ROWAN UNIVERSITY   (United States)

^c IFM   (Sweden)

Author keywords

A. MAX phase; B. Thin films; D. Anisotropy; D. Electronic transport

Indexed keywords

ELECTRIC CONDUCTIVITY; GALVANOMAGNETIC EFFECTS; POLYCRYSTALLINE MATERIALS; THIN FILMS;

ELECTRONIC ANISOTROPY; ELECTRONIC TRANSPORT; LAYERED NANOLAMINATES;

TITANIUM COMPOUNDS;

EID: 44249123021     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2008.03.026     Document Type: Article

References (23)

1. Barsoum M.W. Prog. Solid State Chem. 28 (2000) 201
2. Barsoum M.W. In: Buschow R.W.C.K.H.J., Flemings M.C., Kramer E.J., Mahajan S., and Veyssiere P. (Eds). Encyclopedia of Materials Science and Technology (2006), Elsevier, Amsterdam
3. Barsoum M.W., and Radovic M. In: Buschow R.W.C.K.H.J., Flemings M.C., Kramer E.J., Mahajan S., and Veyssiere P. (Eds). Encyclopedia of Materials Science and Technology (2004), Elsevier, Amsterdam
4. Emmerlich J., Högberg H., Sasvari S., et al. J. Appl. Phys. 96 (2004) 4817
5. Högberg H., Eklund P., Emmerlich J., et al. J. Mater. Res. 20 (2005) 779
6. Högberg H., Hultman L., Emmerlich J., et al. Surface Coatings Tech. 193 (2005) 6
7. Palmquist J.-P., Li S., Persson P.O.Å., et al. Phys. Rev. B 70 (2004) 165401
8. P. Isberg, J.-P. Palmquist, U. Jansson, et al. International Patent WO03/046247 April 14, 2005
9. H.L. Tuller, M.A. Spears, R. Mlcak, US Patent 6544674, June 6, 2002
10. Holm B., Ahuja R., and Johansson B. Appl. Phys. Lett. 79 (2001) 1450
11. Yu R., Zhang X.F., He X.F., et al. J. Mater. Res. 20 (2005) 1180
12. Zhou Y.C., and Sun Z.M. Phys. Rev. B 61 (2000) 12570
13. Zhou Y.C., Dong H.Y., Wang X.H., and Chen S.Q. J. Phys. Condens. Matt. 12 (2000) 9617
14. Emmerlich J., Eklund P., Rittrich D., Högberg H., and Hultman L. J. Mater. Res. 12 (2007) 2279
15. Hettinger J.D., Lofland S.E., Finkel P., et al. Phys. Rev. B 72 (2005) 115120
16. Finkel P., Seaman B., Harrell K., et al. Phys. Rev. B 70 (2004) 085104
17. Finkel P., Barsoum M.W., Hettinger J.D., et al. Phys. Rev. B 67 (2003) 235108
18. Modine F.A., Foegelle M.D., Finch C.B., et al. Phys. Rev. B. 40 (1989) 9558
19. Yoo H.I., Barsoum M.W., and El-Raghy T. Nature 407 (2000) 581
20. Barsoum M.W., Yoo H.I., and El-Raghy T. Phys. Rev. B 62 (2000) 10194
21. McClure J.W. Phys. Rev. 112 (1958) 715
22. Genchev Z.D. Supercond. Sci. Technol. 6 (1993) 532
23. Lofland S.E., Hettinger J.D., Meehan T., Bryan A., Finkel P., and Barsoum M.W. Phys. Rev. B 74 (2006) 174501