-
2
-
-
0033421425
-
-
Pascarelli S., Neisius T., De Panfilis S., Bonfim M., Pizzini S., Mackay K., David S., Fontaine A., San Miguel A., Itix J.P., Gauthier M., Polian A. Synchrotron Radiat. 1999, 6:146.
-
(1999)
Synchrotron Radiat.
, vol.6
, pp. 146
-
-
Pascarelli, S.1
Neisius, T.2
De Panfilis, S.3
Bonfim, M.4
Pizzini, S.5
Mackay, K.6
David, S.7
Fontaine, A.8
San Miguel, A.9
Itix, J.P.10
Gauthier, M.11
Polian, A.12
-
3
-
-
77955515549
-
-
Proceedings of the Eighth International Conference on X-ray Absorption Fine Structure, Phys. B: Condens. Matter 208-209
-
E. Umbach, Proceedings of the Eighth International Conference on X-ray Absorption Fine Structure, Phys. B: Condens. Matter 208-209 (1995) 193.
-
(1995)
, pp. 193
-
-
Umbach, E.1
-
5
-
-
77955518342
-
-
Springer Science+Business Media, LLC
-
Grogger W., Hofer F., Kothleitner G., Schaffer B. An Introduction to High-resolution EELS in Transmission Electron Microscopy 2008, Springer Science+Business Media, LLC.
-
(2008)
An Introduction to High-resolution EELS in Transmission Electron Microscopy
-
-
Grogger, W.1
Hofer, F.2
Kothleitner, G.3
Schaffer, B.4
-
6
-
-
11144275731
-
-
Kimoto K., Kothleitner G., Grogger W., Matsui Y., Hofer F. Micron 2005, 36:185.
-
(2005)
Micron
, vol.36
, pp. 185
-
-
Kimoto, K.1
Kothleitner, G.2
Grogger, W.3
Matsui, Y.4
Hofer, F.5
-
7
-
-
48049084962
-
-
Hitchcock A.P., Dynes J.J., Johansson G., Wang J., Botton G. Micron 2008, 39:741.
-
(2008)
Micron
, vol.39
, pp. 741
-
-
Hitchcock, A.P.1
Dynes, J.J.2
Johansson, G.3
Wang, J.4
Botton, G.5
-
8
-
-
73449106792
-
14th International Conference on X-Ray Absorption Fine Structure (XAFS14)
-
E. Smit, J.F. Creemer, H.W. Zandbergen, B.M. Weckhuysen, F.M.F. de Groot, 14th International Conference on X-Ray Absorption Fine Structure (XAFS14), J. Phys.: Conf. Ser. 190 (2009) 012161.
-
(2009)
J. Phys.: Conf. Ser.
, vol.190
, pp. 012161
-
-
Smit, E.1
Creemer, J.F.2
Zandbergen, H.W.3
Weckhuysen, B.M.4
de Groot, F.M.F.5
-
10
-
-
77955508944
-
-
Browning N.D., Arslan I., Bradley J.P., Chi M., Dai Z., Erni R., Herrera M., Okamoto N.L., Ramasse Q. Microsc. Microanal. 2007, 13(Suppl. 2).
-
(2007)
Microsc. Microanal.
, vol.13
, Issue.SUPPL. 2
-
-
Browning, N.D.1
Arslan, I.2
Bradley, J.P.3
Chi, M.4
Dai, Z.5
Erni, R.6
Herrera, M.7
Okamoto, N.L.8
Ramasse, Q.9
-
12
-
-
4544322822
-
-
Sawada H., Tomita T., Naruse M., Honda T., Hartel P., Haider M., Hetherington C.J.D., Doole Ron C, Kirkland A.I., Hutchison J.L., Titchmarsh J.M., Cockayne D.J.H. Microsc. Microanal. 2004, 10(Suppl. 02):1004.
-
(2004)
Microsc. Microanal.
, vol.10
, Issue.SUPPL. 02
, pp. 1004
-
-
Sawada, H.1
Tomita, T.2
Naruse, M.3
Honda, T.4
Hartel, P.5
Haider, M.6
Hetherington, C.J.D.7
Doole, R.C.8
Kirkland, A.I.9
Hutchison, J.L.10
Titchmarsh, J.M.11
Cockayne, D.J.H.12
-
14
-
-
33750443381
-
-
Brydson R., Sauer H., Engel W., Thomas J.M., Zeitler E., Kosugi N., Kuroda H. J. Phys.: Condens. Matter 1989, 1:797.
-
(1989)
J. Phys.: Condens. Matter
, vol.1
, pp. 797
-
-
Brydson, R.1
Sauer, H.2
Engel, W.3
Thomas, J.M.4
Zeitler, E.5
Kosugi, N.6
Kuroda, H.7
-
15
-
-
0001387387
-
-
de Groot F.M.F., Fuggle J.C., Thole B.T., Sawatzky G.A. Phys. Rev. B 1990, 41:928.
-
(1990)
Phys. Rev. B
, vol.41
, pp. 928
-
-
de Groot, F.M.F.1
Fuggle, J.C.2
Thole, B.T.3
Sawatzky, G.A.4
-
16
-
-
11144313969
-
-
de Groot F.M.F., Figueiredo M.O., Basto M.J., Abbate M., Petersen H., Fuggle J.C. Phys. Chem. Miner. 1992, 19:140.
-
(1992)
Phys. Chem. Miner.
, vol.19
, pp. 140
-
-
de Groot, F.M.F.1
Figueiredo, M.O.2
Basto, M.J.3
Abbate, M.4
Petersen, H.5
Fuggle, J.C.6
-
17
-
-
33644766225
-
-
Walther T., Quandt E., Stegmann H., Thesen A., Benner G. Ultramicroscopy 2006, 106:963.
-
(2006)
Ultramicroscopy
, vol.106
, pp. 963
-
-
Walther, T.1
Quandt, E.2
Stegmann, H.3
Thesen, A.4
Benner, G.5
-
18
-
-
77955515371
-
-
Gatan Inc., Imaging Software DigitalMicrograph™, Gatan Inc., Eastern USA Sales, 780 Commonwealth Drive, Warrendale, PA 15086.
-
Gatan Inc., Imaging Software DigitalMicrograph™ Gatan Inc., Eastern USA Sales, 780 Commonwealth Drive, Warrendale, PA 15086.
-
-
-
-
19
-
-
0002509370
-
-
Springer-Verlag, New York,
-
Daniels J., Festenberg C.V., Raether H., Zepperfield K. Optical Constants of Solids by Electron Spectroscopy, Springer Tracts in Modern Physics 1970, vol. 54. Springer-Verlag, New York, pp. 78-135.
-
(1970)
Optical Constants of Solids by Electron Spectroscopy, Springer Tracts in Modern Physics
, vol.54
, pp. 78-135
-
-
Daniels, J.1
Festenberg, C.V.2
Raether, H.3
Zepperfield, K.4
-
21
-
-
0242291125
-
-
DD11.12.1
-
Naik V.M., Hadda D., Naik R., Benci J., Auner G.W. Mater. Res. Soc. Symp. Proc. 2003, 755. DD11.12.1.
-
(2003)
Mater. Res. Soc. Symp. Proc.
, vol.755
-
-
Naik, V.M.1
Hadda, D.2
Naik, R.3
Benci, J.4
Auner, G.W.5
-
22
-
-
0038502019
-
-
Fine structures resolved electron energy loss measurements of transition metal oxides in transmission electron microscope, Ph.D. Thesis, Institute of Physical and Theoretical Chemistry, Graz University of Technology, May 2003, Ultramicroscopy
-
C. Mitterbauer, Fine structures resolved electron energy loss measurements of transition metal oxides in transmission electron microscope, Ph.D. Thesis, Institute of Physical and Theoretical Chemistry, Graz University of Technology, May 2003, Ultramicroscopy 96 (2003) 469.
-
(2003)
, vol.96
, pp. 469
-
-
Mitterbauer, C.1
-
23
-
-
33747210942
-
-
Bertoni G., Beyers E., Verbeeck J., Mertens M., Cool P., Vansant E.F., Van Tendeloo G. Ultramicroscopy 2006, 106:630. and 〈http://www.cemes.fr/~eelsdb〉.
-
(2006)
Ultramicroscopy
, vol.106
, pp. 630
-
-
Bertoni, G.1
Beyers, E.2
Verbeeck, J.3
Mertens, M.4
Cool, P.5
Vansant, E.F.6
Van Tendeloo, G.7
-
25
-
-
77955511795
-
-
Gloter A., Ewels C., Umek P., Arcon D., Colliex C. Phys. Rev. B 2009, 80:6.
-
(2009)
Phys. Rev. B
, vol.80
, pp. 6
-
-
Gloter, A.1
Ewels, C.2
Umek, P.3
Arcon, D.4
Colliex, C.5
-
26
-
-
42749101122
-
-
Kucheyev S.O., van Buuren T., Satcher J.H., Willey T.M., Meulenberg R.W., Felter T.E., Poco J.F., Gammon S.A., Terminello L.J. Phys. Rev. B 2004, 69:245102.
-
(2004)
Phys. Rev. B
, vol.69
, pp. 245102
-
-
Kucheyev, S.O.1
van Buuren, T.2
Satcher, J.H.3
Willey, T.M.4
Meulenberg, R.W.5
Felter, T.E.6
Poco, J.F.7
Gammon, S.A.8
Terminello, L.J.9
-
27
-
-
0031250134
-
-
Ruus R., Kikas A., Saar A., Ausmees A., Nommiste B., Aarik J., Aidla A., Uustare T., Martinson I. Solid State Commun. 1997, 104:199.
-
(1997)
Solid State Commun.
, vol.104
, pp. 199
-
-
Ruus, R.1
Kikas, A.2
Saar, A.3
Ausmees, A.4
Nommiste, B.5
Aarik, J.6
Aidla, A.7
Uustare, T.8
Martinson, I.9
-
29
-
-
0035276285
-
-
Harada Y., Watanabe M., Eguchi R., Ishiwata Y., Matsubara M., Kotani A., Yagishita A., Shin S. J. Electron Spectrosc. Relat. Phenom. 2001, 114:969.
-
(2001)
J. Electron Spectrosc. Relat. Phenom.
, vol.114
, pp. 969
-
-
Harada, Y.1
Watanabe, M.2
Eguchi, R.3
Ishiwata, Y.4
Matsubara, M.5
Kotani, A.6
Yagishita, A.7
Shin, S.8
-
30
-
-
0035918937
-
-
Sanchez-Agudo M., Soriano L., Quiros C., Avila J., Sanz J.M. Surf. Sci. 2001, 482:470.
-
(2001)
Surf. Sci.
, vol.482
, pp. 470
-
-
Sanchez-Agudo, M.1
Soriano, L.2
Quiros, C.3
Avila, J.4
Sanz, J.M.5
-
31
-
-
77955519106
-
-
Jimenez-Mier J., Diebold U., Ederer D.L., Callcott T.A., Grush M., Perera R.C. Phys. Rev. B 2002, 65:233106.
-
(2002)
Phys. Rev. B
, vol.65
, pp. 233106
-
-
Jimenez-Mier, J.1
Diebold, U.2
Ederer, D.L.3
Callcott, T.A.4
Grush, M.5
Perera, R.C.6
-
32
-
-
0036609296
-
-
Sanchez-Agudo M., Soriano L., Quiros C., Roca L., Perez-Dieste V., Sanz J.M. Surf. Sci. 2002, 507:672.
-
(2002)
Surf. Sci.
, vol.507
, pp. 672
-
-
Sanchez-Agudo, M.1
Soriano, L.2
Quiros, C.3
Roca, L.4
Perez-Dieste, V.5
Sanz, J.M.6
-
33
-
-
34547913502
-
-
Lucovsky G., Seo H., Lee S., Fleming L.B., Ulrich M.D., Luning J., Lysaght P., Bersuker G. Jpn. J. Appl. Phys. Part 1-Regular Pap. Brief Commun. Rev. Pap. 2007, 46:1899.
-
(2007)
Jpn. J. Appl. Phys. Part 1-Regular Pap. Brief Commun. Rev. Pap.
, vol.46
, pp. 1899
-
-
Lucovsky, G.1
Seo, H.2
Lee, S.3
Fleming, L.B.4
Ulrich, M.D.5
Luning, J.6
Lysaght, P.7
Bersuker, G.8
-
38
-
-
33745796585
-
-
Fronzoni G., De Francesco R., Stener M., Causa M. J. Phys. Chem. B 2006, 110:9899.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 9899
-
-
Fronzoni, G.1
De Francesco, R.2
Stener, M.3
Causa, M.4
-
39
-
-
0004548550
-
-
Nyholm R., Martensson N., Lebugle A., Axelsson U. J. Phys. F: Metal Phys. 1981, 11:1727.
-
(1981)
J. Phys. F: Metal Phys.
, vol.11
, pp. 1727
-
-
Nyholm, R.1
Martensson, N.2
Lebugle, A.3
Axelsson, U.4
-
40
-
-
0001088023
-
-
Himpsel F.J., Karlsson U.O., McLean A.B., Terminello L.J., de Groot F.M.F., Abbate M., Fuggle J.C., Yarmoff J.A., Thole B.T., Sawatzky G.A. Phys. Rev. B 1991, 43:6899-6907.
-
(1991)
Phys. Rev. B
, vol.43
, pp. 6899-6907
-
-
Himpsel, F.J.1
Karlsson, U.O.2
McLean, A.B.3
Terminello, L.J.4
de Groot, F.M.F.5
Abbate, M.6
Fuggle, J.C.7
Yarmoff, J.A.8
Thole, B.T.9
Sawatzky, G.A.10
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