Cs corrector for illumination

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1004-1005

  Sawada, H ^a   Tomita, T ^a   Naruse, M ^a   Honda, T ^a   Hartel, P ^b   Haider, M ^b   Hetherington, C J D ^c   Doole, R C ^c   Kirkland, A I ^c   Hutchison, J L ^c   Titchmarsh, J M ^c   Cockayne, D J H ^c  

^a JEOL LTD   (Japan)

^b CEOS GmbH   (Germany)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544322822     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604884897     Document Type: Conference Paper

References (2)

1. M.Haider, S.Uhlemann and J.Zach, Ultramicroscopy, 81 (2000) 163.
2. M.Haider, G.Braunshausen and E.Schwan, Optik,99 (1995) 167.