In-situ scanning transmission X-ray microscopy of catalytic materials under reaction conditions

Journal of Physics: Conference Series

Volumn 190, Issue , 2009, Pages

  Smit, Emiel De ^a   Creemer, J Fredrik ^b   Zandbergen, Henny W ^c   Weckhuysen, Bert M ^a   De Groot, Frank M F ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 73449106792     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/190/1/012161     Document Type: Conference Paper

References (8)

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5. E de Smit, I Swart, J F Creemer, C Karunakaran, D Bertwistle, H W Zandbergen, F M F de Groot and B M Weckhuysen 2009 Angewandte Chemie 48 3632
6. Warwick T, K Franck, J B Kortright, G Meigs, M Moronne, S Myneni, E Rotenberg, S Seal, W F Steele, H Ade, A Garcia, S Cerasari, J Delinger, S Hayakawa, A P Hitchcock, T Tyliszczak, J Kikuma, E G Rightor, H J Shin and B P Tonner 1998 Rev. Sci. Instrum. 69 (8) 2964
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8. Thomas J M and J C Hernandez-Garrido 2009 Angewandte Chemie 48 3904