High-resolution methods for characterizing mesoscale dislocation structures

Journal of Engineering Materials and Technology

Volumn 130, Issue 2, 2008, Pages 0210041-0210045

  Landon, C D ^a   Adams, B L ^a   Kacher, J ^a  

^a Department of Electrical and Computer Engineering   (United States)

Author keywords

Dipoles; Dislocations; EBSD; Mesoscale; OIM; Plasticity

Indexed keywords

NANOCRYSTALLINE MATERIALS; PLASTICITY; STATISTICAL MECHANICS;

DIPOLES; DISLOCATION DENSITIES; DISLOCATION STRUCTURES; EBSD; HIGH-RESOLUTION METHODS; HIGH-RESOLUTION MICROSCOPY; HIGHER-ORDER STRUCTURE; MESOSCALE;

DISLOCATIONS (CRYSTALS);

EID: 47149111402     PISSN: 00944289     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2840961     Document Type: Conference Paper

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