Thickness dependence of the properties of indium tin oxide (ITO) FILMS prepared by activated reactive evaporation

Brazilian Journal of Physics

Volumn 39, Issue 4, 2009, Pages 629-632

  Benoy, M D ^a   Mohammed, E M ^b   Suresh Babu, M ^b   Binu, P J ^b   Pradeep, B ^c  

^a MA College of Engineering   (India)

^b MAHARAJA S COLLEGE   (India)

^c Department of Physics   (India)

Author keywords

ARE; ITO; Thin films

Indexed keywords

EID: 77955479569     PISSN: 01039733     EISSN: None     Source Type: Journal    
DOI: 10.1590/S0103-97332009000600003     Document Type: Article

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