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Materials Science Forum

Volumn 645-648, Issue , 2010, Pages 355-358

Room-temperature photoluminescence observation of stacking faults in 3C-SiC

(3) Hirano, Rii a,b Tajima, Michio a Itoh, Kohei M b

a JAPAN AEROSPACE EXPLORATION AGENCY (Japan)

b KEIO UNIVERSITY (Japan)

Author keywords

3C SiC; Epitaxial layer; Photoluminescence; Stacking faults

Indexed keywords

EPITAXIAL LAYERS; MAPPING; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; STACKING FAULTS;

3C-SIC; BRIGHT LINES; CARBON ATOMS; CUBIC SILICON CARBIDE; PL INTENSITY; PL SPECTRA; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SILICON ATOMS;

SILICON CARBIDE;

EID: 77955464053 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.645-648.355 Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.