메뉴 건너뛰기




Volumn 35, Issue 6, 2000, Pages 745-749

Local melting of the NiAl substrate under deposited Pd clusters during irradiation in a transmission electron microscope

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEPOSITION; ELECTRON BEAMS; IRRADIATION; MELTING; NANOSTRUCTURED MATERIALS; PALLADIUM; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033680195     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4079(200007)35:6/7<745::AID-CRAT745>3.0.CO;2-F     Document Type: Article
Times cited : (1)

References (12)
  • 10
    • 0039631433 scopus 로고
    • Transmission electron microscopy. Physics of image formation and microanalysis
    • Ed. P. W. Hawkes, Springer-Verlag, Berlin-Heidelberg-New York-Barcelona-Budapest-Hong Kong-London-Milan-Paris-Santa Clara-Singapore-Tokyo
    • REIMER L.: Transmission electron microscopy. Physics of Image Formation and Microanalysis, Ed. P. W. Hawkes, Springer Series in Optical Sciences, vol.36, Springer-Verlag, Berlin-Heidelberg-New York-Barcelona-Budapest-Hong Kong-London-Milan-Paris-Santa Clara-Singapore-Tokyo 1993.
    • (1993) Springer Series in Optical Sciences , vol.36
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.