-
3
-
-
24644503146
-
Determination of layer thickness with micro-XRF
-
C. Vogt, and R. Dargel Determination of layer thickness with micro-XRF Appl. Surf. Sci. 252 2005 53 56
-
(2005)
Appl. Surf. Sci.
, vol.252
, pp. 53-56
-
-
Vogt, C.1
Dargel, R.2
-
4
-
-
85058249056
-
Thickness determination of thin polycrystalline film by grazing incidence X-ray diffraction
-
J. Lhotka, R. Kuzel, G. Capuccio, and D. Valvoda Thickness determination of thin polycrystalline film by grazing incidence X-ray diffraction Surf. Coat. Technol. 184 2001 96 101
-
(2001)
Surf. Coat. Technol.
, vol.184
, pp. 96-101
-
-
Lhotka, J.1
Kuzel, R.2
Capuccio, G.3
Valvoda, D.4
-
5
-
-
1842533409
-
Investigations of thin layers by TEY, XRF, EPMA and XPS - A comparison of X-ray analytical methods
-
M.F. Ebel, R. Svagera, M. Lindner, N. Praxmarer, C. Hager, and H. Ebel Investigations of thin layers by TEY, XRF, EPMA and XPS - a comparison of X-ray analytical methods Adv. X-ray Anal. 41 1999 62 75
-
(1999)
Adv. X-ray Anal.
, vol.41
, pp. 62-75
-
-
Ebel, M.F.1
Svagera, R.2
Lindner, M.3
Praxmarer, N.4
Hager, C.5
Ebel, H.6
-
6
-
-
0036693510
-
Characterization of ultrathin layers on PET by RBS and XRF
-
M. Draxler, S. Zoister, F. Kastner, H. Bergsmann, and P. Bauer Characterization of ultrathin layers on PET by RBS and XRF Surf. Interface Anal. 34 2002 763 766
-
(2002)
Surf. Interface Anal.
, vol.34
, pp. 763-766
-
-
Draxler, M.1
Zoister, S.2
Kastner, F.3
Bergsmann, H.4
Bauer, P.5
-
7
-
-
24644443809
-
Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range
-
M. Kolbe, B. Beckhoff, B. Krumrey, and G. Ulm Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range Appl. Surf. Sci. 252 2005 49 52
-
(2005)
Appl. Surf. Sci.
, vol.252
, pp. 49-52
-
-
Kolbe, M.1
Beckhoff, B.2
Krumrey, B.3
Ulm, G.4
-
8
-
-
37749002367
-
Portable X-ray fluorescence spectrometer for coating thickness measurement
-
A. Carapelle, K. Fleury-Frenette, J.P. Collette, H.P. Garnir, and P. Harlet Portable X-ray fluorescence spectrometer for coating thickness measurement Rev. Sci. Instrum. 78 2007 123 125
-
(2007)
Rev. Sci. Instrum.
, vol.78
, pp. 123-125
-
-
Carapelle, A.1
Fleury-Frenette, K.2
Collette, J.P.3
Garnir, H.P.4
Harlet, P.5
-
9
-
-
58049182041
-
Fundamental parameter methods in XRF spectroscopy
-
H.A. Van Sprang Fundamental parameter methods in XRF spectroscopy Adv. X-ray Anal. 42 2000 1 10
-
(2000)
Adv. X-ray Anal.
, vol.42
, pp. 1-10
-
-
Van Sprang, H.A.1
-
10
-
-
19944406836
-
Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry
-
DOI 10.1016/j.sab.2005.03.018, PII S0584854705000777
-
M. Kolbe, B. Beckhoff, B. Krumrey, and G. Ulm Thickness determination for Cu and Ni nanolayers: comparison of completely reference free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry Spectrochim. Acta Part B 60 2005 505 510 (Pubitemid 40748465)
-
(2005)
Spectrochimica Acta - Part B Atomic Spectroscopy
, vol.60
, Issue.4
, pp. 505-510
-
-
Kolbe, M.1
Beckhoff, B.2
Krumrey, M.3
Ulm, G.4
-
12
-
-
0037041127
-
The growth and properties of GaN:As layers prepared by plasma-assisted molecular beam epitaxy
-
C.T. Foxon, I. Harrison, S.V. Novikov, A.J. Winser, R.P. Campion, and T. Li The growth and properties of GaN:As layers prepared by plasma-assisted molecular beam epitaxy J. Phys. Condens. Matter 14 2002 3383 3391
-
(2002)
J. Phys. Condens. Matter
, vol.14
, pp. 3383-3391
-
-
Foxon, C.T.1
Harrison, I.2
Novikov, S.V.3
Winser, A.J.4
Campion, R.P.5
Li, T.6
-
13
-
-
0037382835
-
Arsenic incorporation in GaN during growth by molecular beam epitaxy
-
C.T. Foxon, S.V. Novikov, T. Li, R.P. Campion, A.J. Winser, I. Harrison, M.J. Kappers, and C.J. Humphreys Arsenic incorporation in GaN during growth by molecular beam epitaxy J. Cryst. Growth 251 2003 510 514
-
(2003)
J. Cryst. Growth
, vol.251
, pp. 510-514
-
-
Foxon, C.T.1
Novikov, S.V.2
Li, T.3
Campion, R.P.4
Winser, A.J.5
Harrison, I.6
Kappers, M.J.7
Humphreys, C.J.8
-
14
-
-
34748926401
-
Raman scattering study of undoped and As-doped GaN grown with different III/V ratios
-
J. Ibañez, D. Pastor, E. Alarcón-Lladó, R. Cuscó, L. Artús, S.V. Novikov, and C.T. Foxon Raman scattering study of undoped and As-doped GaN grown with different III/V ratios Semicond. Sci. Technol. 22 2007 1145 1150
-
(2007)
Semicond. Sci. Technol.
, vol.22
, pp. 1145-1150
-
-
Ibañez, J.1
Pastor, D.2
Alarcón-Lladó, E.3
Cuscó, R.4
Artús, L.5
Novikov, S.V.6
Foxon, C.T.7
-
16
-
-
77955416237
-
ICH, International Conference on Harmonization of technical requirements for registration of pharmaceuticals for human use
-
ICH, International Conference on Harmonization of technical requirements for registration of pharmaceuticals for human use. Validation of analytical procedures: Text and Methodology Q2(R1), November 2005.
-
(2005)
Validation of Analytical Procedures: Text and Methodology Q2 (R1)
-
-
-
17
-
-
59849115009
-
Improvement approaches for the determination of Cr(VI), Cd(II), Pd(II) and Pt(IV) contained in aqueous samples by conventional XRF instrumentation
-
C. Fontas, E. Margui, M. Hidalgo, and I. Queralt Improvement approaches for the determination of Cr(VI), Cd(II), Pd(II) and Pt(IV) contained in aqueous samples by conventional XRF instrumentation X-ray Spectrom. 38 2009 9 17
-
(2009)
X-ray Spectrom.
, vol.38
, pp. 9-17
-
-
Fontas, C.1
Margui, E.2
Hidalgo, M.3
Queralt, I.4
-
18
-
-
71549146278
-
Quantitative X-ray fluorescence analysis of samples of less than 'infinite thickness': Difficulties and possibilities
-
R. Sitko Quantitative X-ray fluorescence analysis of samples of less than 'infinite thickness': difficulties and possibilities Spectrochim. Acta Part B 64 2009 1161 1172
-
(2009)
Spectrochim. Acta Part B
, vol.64
, pp. 1161-1172
-
-
Sitko, R.1
-
19
-
-
18544387014
-
Non destructive analysis of gold alloys using energy dispersive X-ray fluorescence analysis
-
V. Roessiger, and B. Nensel Non destructive analysis of gold alloys using energy dispersive X-ray fluorescence analysis Gold Bull. 36 2003 125 137
-
(2003)
Gold Bull.
, vol.36
, pp. 125-137
-
-
Roessiger, V.1
Nensel, B.2
-
21
-
-
0036693510
-
Characterization of ultrathin Cr layers on PET by RBS and XRF
-
M. Draxler, S. Zoister, F. Kastner, M. Bergsmann, and P. Bauer Characterization of ultrathin Cr layers on PET by RBS and XRF X-ray Spectrom. 34 2002 763 766
-
(2002)
X-ray Spectrom.
, vol.34
, pp. 763-766
-
-
Draxler, M.1
Zoister, S.2
Kastner, F.3
Bergsmann, M.4
Bauer, P.5
-
22
-
-
0000886330
-
WinFTM: Eine neue Software für die Schichtdickenmessung nach dem Röntgenfluoreszenz-Verfahren
-
Metall Verlag Heidelberg
-
V. Roessiger, and K.H. Kaiser WinFTM: eine neue Software für die Schichtdickenmessung nach dem Röntgenfluoreszenz-Verfahren Jahrbuch Oberflächentechnik 1998 Metall Verlag Heidelberg S313
-
(1998)
Jahrbuch Oberflächentechnik
, pp. 313
-
-
Roessiger, V.1
Kaiser, K.H.2
|