Correlation between structure and optical properties in low emissivity coatings for solar thermal collectors

Thin Solid Films

Volumn 518, Issue 20, 2010, Pages 5720-5723

  Yuste, M ^a,c   Galindo, R Escobar ^a,b   Sanchez O ^a   Cano, D ^c   Casasola, R ^d   Albella, J M ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^c Fundación Rafael Escolá   (Spain)

^d Isofoton SA   (Spain)

Author keywords

Low emissivity; Magnetron sputtering; Optical transmittance; TiN

Indexed keywords

CHEMICAL COMPOSITIONS; CRYSTALLINE ORIENTATIONS; DEPOSITION PARAMETERS; EMITTANCES; FAR INFRARED; GLOW-DISCHARGE OPTICAL EMISSION SPECTROSCOPY; LOW-EMISSIVITY COATING; OPTICAL TRANSMITTANCE; PREFERENTIAL ORIENTATION; SOLAR THERMAL COLLECTOR; STRUCTURE AND MORPHOLOGY; TIN COATING; VISIBLE RANGE; VISIBLE TRANSMITTANCE;

ATOMIC SPECTROSCOPY; COATINGS; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; GLOW DISCHARGES; HARDENING; MAGNETRON SPUTTERING; OPACITY; OPTICAL CORRELATION; SPECTROSCOPIC ELLIPSOMETRY; TITANIUM NITRIDE; WAVELET TRANSFORMS; X RAY DIFFRACTION;

OPTICAL EMISSION SPECTROSCOPY;

EID: 77955418182     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.05.056     Document Type: Conference Paper

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