메뉴 건너뛰기




Volumn 65, Issue 8, 2010, Pages 695-701

Depth profiling of coated metallic artifacts adopting laser-induced breakdown spectrometry

Author keywords

Coated metallic artifacts; Depth profiling; Laser induced breakdown spectroscopy

Indexed keywords

ABLATION RATES; ANALYTICAL TECHNIQUES; COATED METALLIC ARTIFACTS; CRATER DEPTH; CRITICAL PARAMETER; CU SUBSTRATE; CULTURAL HERITAGE FIELD; DEPTH-PROFILING ANALYSIS; FOCAL LENGTHS; GOLD-COATED; INTERSECTION POINTS; LASER IRRADIANCE; LASER-INDUCED BREAKDOWN SPECTROMETRIES; LAYERED MATERIAL; ND : YAG LASERS; NOVEL TECHNIQUES; WORKING DISTANCES;

EID: 77955412827     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2010.03.017     Document Type: Conference Paper
Times cited : (47)

References (24)
  • 1
    • 0036012731 scopus 로고    scopus 로고
    • Laser-induced breakdown spectrometry in the jewellery industry. Part II Determination of the layer thickness and composition of gold-plated pieces
    • A. Jurado-Lopez, and M.D. Luque de Castro Laser-induced breakdown spectrometry in the jewellery industry. Part II Determination of the layer thickness and composition of gold-plated pieces J. Anal. At. Spectrom. 17 2002 544 547
    • (2002) J. Anal. At. Spectrom. , vol.17 , pp. 544-547
    • Jurado-Lopez, A.1    Luque De Castro, M.D.2
  • 4
    • 33749275052 scopus 로고    scopus 로고
    • Functional group identification in scanning tunneling microscopy of molecular adsorbates
    • D.M. Cyr, B. Venkatamaran, G.W. Flynn, A. Black, and G.M. Whitesides Functional group identification in scanning tunneling microscopy of molecular adsorbates J. Phys. Chem. 100 1996 13747 13759
    • (1996) J. Phys. Chem. , vol.100 , pp. 13747-13759
    • Cyr, D.M.1    Venkatamaran, B.2    Flynn, G.W.3    Black, A.4    Whitesides, G.M.5
  • 6
    • 0001336528 scopus 로고
    • Observation of electrical conductivity during XPS analysis of organic oils
    • G. Beamson, D.T. Clark, N.W. Hayes, and D.S.L. Law Observation of electrical conductivity during XPS analysis of organic oils Surf. Sci. Spectra 3 1994 366 374
    • (1994) Surf. Sci. Spectra , vol.3 , pp. 366-374
    • Beamson, G.1    Clark, D.T.2    Hayes, N.W.3    Law, D.S.L.4
  • 7
    • 0030038307 scopus 로고    scopus 로고
    • Electrochemically controlled adhesion in atomic force spectroscopy
    • V. Hudson, and H.D. Abruna Electrochemically controlled adhesion in atomic force spectroscopy J. Am. Chem. Soc. 118 1996 6303 6304
    • (1996) J. Am. Chem. Soc. , vol.118 , pp. 6303-6304
    • Hudson, V.1    Abruna, H.D.2
  • 8
    • 0000300918 scopus 로고
    • Measuring the structure of etched silicon surfaces with Raman spectroscopy
    • M.A. Hines, Y.J. Chabal, T.D. Harris, and A.L. Harris Measuring the structure of etched silicon surfaces with Raman spectroscopy J. Chem. Phys 101 1994 8055 8072
    • (1994) J. Chem. Phys , vol.101 , pp. 8055-8072
    • Hines, M.A.1    Chabal, Y.J.2    Harris, T.D.3    Harris, A.L.4
  • 10
    • 0037107361 scopus 로고    scopus 로고
    • Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis
    • R. Klockenkamper, H.W. Becker, H. Bubert, H. Jenett, and A. Von Bohlen Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis Spectrochim. Acta Part B 57 2002 1593 1599
    • (2002) Spectrochim. Acta Part B , vol.57 , pp. 1593-1599
    • Klockenkamper, R.1    Becker, H.W.2    Bubert, H.3    Jenett, H.4    Von Bohlen, A.5
  • 11
    • 0026895534 scopus 로고
    • Quantitative evaluation of depth profiles analyzed by glow discharge optical emission spectroscopy: Analysis of diffusion processes
    • Z. Weiss Quantitative evaluation of depth profiles analyzed by glow discharge optical emission spectroscopy: analysis of diffusion processes Spectrochim. Acta Part B 47 1992 859 876
    • (1992) Spectrochim. Acta Part B , vol.47 , pp. 859-876
    • Weiss, Z.1
  • 12
    • 0035128091 scopus 로고    scopus 로고
    • Improved quantitative analysis of hard coatings by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES)
    • R. Payling, M. Aeberhard, and D. Delfosse Improved quantitative analysis of hard coatings by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES) J. Anal. At. Spectrom 16 2001 50 55
    • (2001) J. Anal. At. Spectrom , vol.16 , pp. 50-55
    • Payling, R.1    Aeberhard, M.2    Delfosse, D.3
  • 15
    • 0037205592 scopus 로고    scopus 로고
    • Quantitative micro-analysis by laser-induced breakdown spectroscopy: A review of the experimental approaches
    • E. Tognoni, V. Palleschi, M. Corsi, and G. Cristoforetti Quantitative micro-analysis by laser-induced breakdown spectroscopy: a review of the experimental approaches Spectrochim. Acta Part B 57 2002 1115 1130
    • (2002) Spectrochim. Acta Part B , vol.57 , pp. 1115-1130
    • Tognoni, E.1    Palleschi, V.2    Corsi, M.3    Cristoforetti, G.4
  • 16
    • 0032026938 scopus 로고    scopus 로고
    • Depth profiling of phosphorus in photonic-grade silicon using laser-induced breakdown spectrometry
    • M. Milan, P. Lucena, L.M. Cabalin, and J.J. Laserna Depth profiling of phosphorus in photonic-grade silicon using laser-induced breakdown spectrometry Appl. Spectrosc. 5 1998 444 448
    • (1998) Appl. Spectrosc. , vol.5 , pp. 444-448
    • Milan, M.1    Lucena, P.2    Cabalin, L.M.3    Laserna, J.J.4
  • 17
    • 0032141332 scopus 로고    scopus 로고
    • Nanometric range depth-resolved analysis of coated-steels using laser-induced breakdown spectrometry with a 308 nm collimated beam
    • J.M. Vadillo, C. Garcia, S. Palanco, and J.J. Laserna Nanometric range depth-resolved analysis of coated-steels using laser-induced breakdown spectrometry with a 308 nm collimated beam J. Anal. At. Spectrom 13 1998 793 797
    • (1998) J. Anal. At. Spectrom , vol.13 , pp. 793-797
    • Vadillo, J.M.1    Garcia, C.2    Palanco, S.3    Laserna, J.J.4
  • 18
    • 1242322497 scopus 로고    scopus 로고
    • Laser-induced plasma spectrometry: Truly a surface analytical tool
    • J.M. Vadillo, and J.J. Laserna Laser-induced plasma spectrometry: truly a surface analytical tool Spectrochim. Acta Part B 59 2004 147 161
    • (2004) Spectrochim. Acta Part B , vol.59 , pp. 147-161
    • Vadillo, J.M.1    Laserna, J.J.2
  • 19
    • 0034740365 scopus 로고    scopus 로고
    • Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry
    • M.P. Mateo, J.M. Vadillo, and J.J. Laserna Irradiance-dependent depth profiling of layered materials using laser-induced plasma spectrometry J. Anal. At. Spectrom. 16 2001 1317 1321
    • (2001) J. Anal. At. Spectrom. , vol.16 , pp. 1317-1321
    • Mateo, M.P.1    Vadillo, J.M.2    Laserna, J.J.3
  • 20
    • 0034224159 scopus 로고    scopus 로고
    • Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials
    • C.C. Garcia, M. Corral, J.M. Vadillo, and J.J. Laserna Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials Appl. Spectrosc 54 2002 1027
    • (2002) Appl. Spectrosc , vol.54 , pp. 1027
    • Garcia, C.C.1    Corral, M.2    Vadillo, J.M.3    Laserna, J.J.4
  • 21
    • 33646433461 scopus 로고    scopus 로고
    • Comparison of detection limits, for two metallic matrices, of laser-induced breakdown spectroscopy in the single and double-pulse configurations
    • M.A. Ismail, G. Cristoforetti, S. Legnaioli, L. Pardini, V. Palleschi, A. Salvetti, E. Tognoni, and M.A. Harith Comparison of detection limits, for two metallic matrices, of laser-induced breakdown spectroscopy in the single and double-pulse configurations Anal. Bional. Chem. 385 2006 316 325
    • (2006) Anal. Bional. Chem. , vol.385 , pp. 316-325
    • Ismail, M.A.1    Cristoforetti, G.2    Legnaioli, S.3    Pardini, L.4    Palleschi, V.5    Salvetti, A.6    Tognoni, E.7    Harith, M.A.8
  • 22
    • 44449158564 scopus 로고    scopus 로고
    • Temporal follow up of the LTE conditions in aluminium laser induced plasma at different laser energies
    • A.H. Galmed, and M.A. Harith Temporal follow up of the LTE conditions in aluminium laser induced plasma at different laser energies Appl. Phys. B 91 2008 651 660
    • (2008) Appl. Phys. B , vol.91 , pp. 651-660
    • Galmed, A.H.1    Harith, M.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.