Optical properties of evolutionary grown layers of carbon nanowalls analyzed by spectroscopic ellipsometry

Japanese Journal of Applied Physics

Volumn 49, Issue 6 PART 1, 2010, Pages 0602201-0602203

  Kawai, Shinji ^a   Kondo, Shingo ^b   Takeuchi, Wakana ^b   Kondo, Hiroki ^b   Hiramatsu, Mineo ^c   Hori, Masaru ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c MEIJO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOWALLS; COMPLEX DIELECTRIC FUNCTIONS; EFFECTIVE MEDIUM APPROXIMATION; EXTINCTION COEFFICIENT (K); GRAPHENE SHEETS; GROWTH LAYERS; IMAGINARY PARTS; INTERFACIAL LAYER; RADICAL INJECTION; TAUC-LORENTZ MODELS;

GRAPHENE; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SEMICONDUCTOR GROWTH; SPECTROSCOPIC ELLIPSOMETRY;

AMORPHOUS CARBON;

EID: 77955325532     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.060220     Document Type: Article

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