A fully automatic ocular artifact suppression from EEG data using higher order statistics: Improved performance by wavelet analysis

Medical Engineering and Physics

Volumn 32, Issue 7, 2010, Pages 720-729

  Ghandeharion, Hosna ^a   Erfanian, Abbas ^a  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

Author keywords

Electroencephalogram; Independent component analysis; Ocular artifact; Wavelet analysis

Indexed keywords

HIGHER ORDER STATISTICS; INDEPENDENT COMPONENT ANALYSIS; WAVELET ANALYSIS;

ARTIFACT REMOVAL; ELECTROENCEPHALOGRAPHIC (EEG); IDENTIFICATION PROCEDURE; INDEPENDENT COMPONENT ANALYSIS(ICA); MUTUAL INFORMATIONS; OCULAR ARTIFACTS; OFF-LINE TRAINING; THRESHOLD LEVELS;

ELECTROENCEPHALOGRAPHY;

ACCURACY; ARTICLE; ARTIFACT; AUTOMATION; ELECTROENCEPHALOGRAM; INDEPENDENT COMPONENT ANALYSIS; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; PRIORITY JOURNAL; SENSITIVITY AND SPECIFICITY; STATISTICAL ANALYSIS; STATISTICS; VISUAL SYSTEM FUNCTION;

EID: 77955267764     PISSN: 13504533     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.medengphy.2010.04.010     Document Type: Article

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