A system for automatic artifact removal in ictal scalp EEG based on independent component analysis and Bayesian classification

Clinical Neurophysiology

Volumn 117, Issue 4, 2006, Pages 912-927

  LeVan, P ^a   Urrestarazu, E ^a   Gotman, J ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

Artifacts; Automatic; Bayesian classifiers; EEG; Independent component analysis; Seizure

Indexed keywords

ARTICLE; ARTIFACT; BAYES THEOREM; CLINICAL ARTICLE; CONTROLLED STUDY; ELECTROENCEPHALOGRAM; HUMAN; INDEPENDENT COMPONENT ANALYSIS; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; SEIZURE; SENSITIVITY AND SPECIFICITY; TECHNIQUE; VALIDATION PROCESS;

ALGORITHMS; ARTIFACTS; BAYES THEOREM; ELECTRODES; ELECTROENCEPHALOGRAPHY; EPILEPSY; EVOKED POTENTIALS; HUMANS; REACTION TIME; SCALP; SIGNAL PROCESSING, COMPUTER-ASSISTED; TIME FACTORS;

EID: 33644886576     PISSN: 13882457     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.clinph.2005.12.013     Document Type: Article

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