The influence of nanoscale defects on the fracture of multi-walled carbon nanotubes under tensile loading

Diamond and Related Materials

Volumn 19, Issue 7-9, 2010, Pages 748-751

  Yamamoto, Go ^a   Suk, Ji Won ^b   An, Jinho ^b   Piner, Richard D ^b   Hashida, Toshiyuki ^a   Takagi, Toshiyuki ^a   Ruoff, Rodney S ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b The University of Texas at Austin   (United States)

Author keywords

Defects; Mechanical properties; Nanostructures; Nanotubes

Indexed keywords

ACID ETCHING; ACID TREATMENTS; MECHANICAL BEHAVIOR; MICROSTRUCTURAL OBSERVATIONS; NANO MANIPULATOR; NANOSCALE DEFECTS; SCANNING ELECTRON MICROSCOPES; SEM; STRUCTURAL DISORDERS; TENSILE LOADING; TENSILE-LOADING EXPERIMENTS; TRANSMISSION ELECTRON MICROSCOPE;

ACIDS; CARBON NANOTUBES; CHEMICAL SENSORS; DEFECTS; ELECTRON MICROSCOPES; FRACTURE; MULTIWALLED CARBON NANOTUBES (MWCN); NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; STRESS CONCENTRATION; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

MECHANICAL PROPERTIES;

EID: 77955230681     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2010.01.045     Document Type: Article

References (29)

1. A.A. Mamedov, N.A. Kotov, M. Prato, D.M. Guldi, J.P. Wicksted, and A. Hirsch Nat. Mater. 1 2002 190
2. G.D. Zhan, J.D. Kuntz, J. Wan, and A.K. Mukherjee Nat. Mater. 2 2002 38
3. X. Wang, N.P. Padture, and H. Tanaka Nat. Mater. 3 2004 539
4. G. Yamamoto, Y. Sato, T. Takahashi, M. Omori, T. Hashida, A. Okubo, and K. Tohji J. Mater. Res. 21 2006 1537
5. G. Yamamoto, Y. Sato, T. Takahashi, M. Omori, A. Okubo, K. Tohji, and T. Hashida Scripta Mater. 54 2006 299
6. N. Hu, Z. Masuda, C. Yan, G. Yamamoto, H. Fukunaga, and T. Hashida Nanotechnology 19 2008 215701
7. G. Yamamoto, M. Omori, T. Hashida, and H. Kimura Nanotechnology 19 2008 315708
8. G. Yamamoto, M. Omori, K. Yokomizo, T. Hashida, and K. Adachi Mater. Sci. Eng. B 148 2008 265
9. E. Hernandez, C. Goze, P. Bernier, and A. Rubio Phys. Rev. Lett. 80 1998 4502
10. T. Ozaki, Y. Iwasa, and T. Mitani Phys. Rev. Lett. 84 2000 1712
11. T. Dumitrica, T. Belytschko, and B.I. Yakobson J. Chem. Phys. 118 2003 9485
12. S. Ogata, and Y. Shibutani Phys. Rev. B 68 2003 165409
13. D. Troya, S.L. Mielke, and G.C. Schatz Chem. Phys. Lett. 382 2003 133
14. S.L. Mielke, D. Troya, S. Zhang, J.L. Li, S.P. Xiao, R. Car, R.S. Ruoff, G.C. Schatz, and T. Belytschko Chem. Phys. Lett. 390 2004 413
15. M.F. Yu, O. Lourie, M.J. Dyer, K. Moloni, T.F. Kelly, and R.S. Ruoff Science 287 2000 637
16. A.H. Barber, R. Andrews, L.S. Schadler, and H.D. Wagner Appl. Phys. Lett. 87 2005 203106
17. A.H. Barber, I. Kaplan-Ashiri, S.R. Cohen, R. Tenne, and H.D. Wagner Compos. Sci. Technol. 65 2005 2380
18. W. Ding, L. Calabri, K.M. Kohlhaas, X. Chen, D.A. Dikin, and R.S. Ruoff Exp. Mech. 47 2007 25
19. B. Peng, M. Locascio, P. Zapol, S. Li, S.L. Mielke, G.C. Schatz, and H.D. Espinosa Nat. Nanotechnol. 3 2008 626
20. Y.A. Kim, T. Hayashi, M. Endo, Y. Kaburagi, T. Tsukada, J. Shan, K. Osato, and S. Tsuruoka Carbon 43 2005 2243
21. J. Chen, J.Y. Shan, T. Tsukada, F. Munekane, A. Kuno, M. Matsuo, T. Hayashi, Y.A. Kim, and M. Endo Carbon 45 2007 274
22. J.P. Salvetat, A.J. Kulik, J.M. Bonard, G.A.D. Briggs, T. Stockli, K. Metenier, S. Bonnamy, F. Beguin, N.A. Burnham, and L. Forro Adv. Mater. 11 1999 161
23. S.L. Mielke, S. Zhang, R. Khare, R.S. Ruoff, T. Belytschko, and G.C. Schatz Chem. Phys. Lett. 446 2007 128
24. W.Q. Ding, L. Calabri, X.Q. Chen, K.M. Kohhaas, and R.S. Ruoff Compos. Sci. Technol. 66 2006 1112
25. W. Ding, D.A. Dikin, X. Chen, R.D. Piner, R.S. Ruoff, E. Zussman, X. Wang, and X. Li J. Appl. Phys. 98 2005 014905
26. J.E. Sader, J.W.M. Chon, and P. Mulvaney Rev. Sci. Instrum. 70 1999 3967
27. J.E. Sader, I. Larson, P. Mulvaney, and L.R. White Rev. Sci. Instrum. 66 1995 3789
28. G.G. Tibbetts, and C.P. Beetz J. Phys. D-Appl. Phys. 20 1987 292
29. W. Ding, Z. Guo, and R.S. Ruoff J. Appl. Phys. 101 2007 034316