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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3098, Issue , 1997, Pages 514-519

Tunnel noise spectroscopy by reflection SNOM and STM

(4) Tománek, Pavel a Grmela, Lubomír a Brüstlová, Jitka a Dobis, Pavel a

a BRNO UNIVERSITY OF TECHNOLOGY (Czech Republic)

Author keywords

1 f noise; local index variation; measurements; r SNOM; STM; tunnel noise spectroscopy

Indexed keywords

1/F NOISE; BAND MODEL; LOCAL INDEX; LOW-FREQUENCY NOISE; NOISE SOURCE; NOISE SPECTRA; NOISE SPECTROSCOPY; PHYSICAL SYSTEMS; R-SNOM; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY (STM); SEMI-CONDUCTOR SURFACES; SILICON CRYSTAL; STM; THIN GOLD FILM;

ACOUSTIC NOISE; GOLD COATINGS; OPTICAL TESTING; SCANNING TUNNELING MICROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0011005818 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.281197 Document Type: Conference Paper

Times cited : (2)

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9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.