Local optical and electric characteristics of solar cells

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7388, Issue , 2009, Pages

  Tománek, Pavel ^a   Škarvada, Pavel ^a   Grmela, Lubomír ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Electric measurement; Microplasma; Near field optics; Scanning probe microscopy; Solar cell; Surface topography

Indexed keywords

CELL EFFICIENCY; CELL SURFACES; CLASSICAL METHODS; COPPER INDIUM GALLIUM DISELENIDE; CRYSTALLINE SILICON SOLAR CELLS; DEFECTS AND IMPURITIES; DIAGNOSTIC TOOLS; ELECTRIC CHARACTERISTICS; ELECTRIC MEASUREMENTS; EXPERIMENTAL STUDIES; FAR-FIELD; HIGH RESOLUTION; LIFE-TIMES; LIGHT-TRAPPING; MICRO-PLASMAS; MONOCRYSTALLINE; MONOCRYSTALLINE SILICON SOLAR CELLS; MULTICRYSTALLINE; NEAR FIELD OPTICS; NEAR-FIELD; OPTICAL BEAMS; P-N JUNCTION; PHOTOVOLTAIC SOLAR CELLS; POLY-CRYSTALLINE SILICON; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SCANNING PROBE MICROSCOPE; SILICON CRYSTAL; SUPERRESOLVING; SURFACE DAMAGES; THIN-FILM SOLAR CELLS; TRANSPORT CHARACTERISTICS;

AMORPHOUS FILMS; CADMIUM; CADMIUM COMPOUNDS; CADMIUM TELLURIDE; CELL MEMBRANES; CRYSTAL IMPURITIES; CYTOLOGY; DISLOCATIONS (CRYSTALS); ELECTRIC VARIABLES MEASUREMENT; GALLIUM; GRAIN BOUNDARIES; INDIUM; LIGHT; METAMATERIALS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOVOLTAIC CELLS; PLASMA DISPLAY DEVICES; POLYCRYSTALLINE MATERIALS; POLYSILICON; PROBES; SCANNING; SCANNING PROBE MICROSCOPY; SELENIUM COMPOUNDS; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR POWER GENERATION; SURFACE DEFECTS; SURFACE TOPOGRAPHY;

AMORPHOUS SILICON;

EID: 77952002941     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.849661     Document Type: Conference Paper

References (12)

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