Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

IEEE Transactions on Magnetics

Volumn 44, Issue 11 PART 1, 2008, Pages 3248-3251

  Cespedes O ^a   Luu, A ^a   Rhen, F M F ^a   Coey, J M D ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Electrodeposition; Focused ion beam milling; Magnetic force microscopy (MFM); Tip fabrication

Indexed keywords

EID: 77955113153     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2002866     Document Type: Article

References (20)

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