Determination of the spatial resolution of an aperture-type near-field scanning optical microscope using a standard sample of a quantum-dot-embedded polymer film

Journal of the Korean Physical Society

Volumn 56, Issue 6, 2010, Pages 1748-1753

  Kim, Jeongyong ^a   Kim, D C ^a   Nakajima, K ^b   Mitsui, T ^c   Aoki, H ^d  

^a SolarLight Ltd   (South Korea)

^b TOHOKU UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d KYOTO UNIVERSITY   (Japan)

Author keywords

Near field; NSOM; Quantum dot; SNOM; Spatial resolution; Standard

Indexed keywords

EID: 77954851588     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.56.1748     Document Type: Article

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