Evaluation of nano-optical probe from scanning near-field optical microscope images

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 369-373

  Hosaka, S ^a   Shintani, T ^a   Kikukawa, A ^a   Itoh, K ^a  

^a HITACHI LTD   (Japan)

Author keywords

Knife edge method; Modulated transfer function method; Nano optical probe; Scanning near field optical microscope

Indexed keywords

FUNCTION EVALUATION; MICROSCOPES; SILICA; TRANSFER FUNCTIONS;

EDGE METHOD; KNIFE EDGE; KNIFE-EDGE METHOD; MODULATED TRANSFER FUNCTION METHOD; MODULATED TRANSFER FUNCTIONS; NANO-OPTICAL PROBE; NANOMETRES; OPTICAL PROBE; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; TRANSFER FUNCTION METHOD;

PROBES;

ALUMINUM; NANOPARTICLE; SILICON DIOXIDE; TUNGSTEN;

CONFERENCE PAPER; FIBER OPTICS; ILLUMINATION; MICROSCOPE IMAGE; MODULATION TRANSFER FUNCTION; PIPETTE; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032989970     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00539.x     Document Type: Conference Paper

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