In situ TEM monitoring of thermal decomposition in individual boron nitride nanotubes

JOM

Volumn 62, Issue 4, 2010, Pages 69-73

  Ghassemi, Hessam M ^a   Lee, Chee H ^b   Yap, Yoke K ^b   Yassar, Reza S ^a  

^a Michigan Technological University   (United States)

^b MICHIGAN TECHNOLOGICAL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS NANOCLUSTERS; BORON NITRIDE NANOTUBES; ELECTRICAL CURRENT; ELEVATED TEMPERATURE; IN-SITU TEM; MULTI-WALLED; ONE-DIMENSIONAL NANOMATERIALS; SHELL LAYERS; STRUCTURAL DEFECT; STRUCTURAL FAILURE; THERMAL DECOMPOSITIONS; THERMAL FAILURE; TRANSMISSION ELECTRON MICROSCOPE;

BORON; FRACTURE MECHANICS; MICROELECTRONICS; NANOTUBES; NITRIDES; PYROLYSIS; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

BORON NITRIDE;

EID: 77954793125     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-010-0063-1     Document Type: Article

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