In-situ nanomechanical testing of one-dimensional materials

Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009

Volumn 1, Issue , 2009, Pages 318-322

  Ghassemi, H ^a   Yap, Y K ^a   Yassar, R S ^a  

^a Michigan Technological University   (United States)

Author keywords

AFM; In situ; Nanotube; STM; TEM

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; BN NANOTUBE; BORON NITRIDE NANOTUBES; BUILDING BLOCKES; FORCE-DISPLACEMENT CURVES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; IN-SITU; NANO-DEVICES; NANOMECHANICAL TESTING; ONE-DIMENSIONAL MATERIALS; ONE-DIMENSIONAL NANOMATERIALS; TEM;

ATOMIC FORCE MICROSCOPY; BORON; BORON NITRIDE; ELECTRON MICROSCOPES; MATERIALS TESTING; MECHANICAL PROPERTIES; MECHANICAL TESTING; MEMS; MICROELECTROMECHANICAL DEVICES; NANOSTRUCTURED MATERIALS; NITRIDES; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 70450203732     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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