Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in

Proceedings of the Annual ACM Symposium on Theory of Computing

Volumn , Issue , 2010, Pages 649-657

  Karnin, Zohar S ^a   Mukhopadhyay, Partha ^a   Shpilka, Amir ^a   Volkovich, Ilya ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

arithmetic circuits; bounded depth circuits; derandomization; identity testing; multilinear circuits

Indexed keywords

ARITHMETIC CIRCUIT; BOUNDED DEPTH CIRCUITS; DERANDOMIZATION; IDENTITY TESTING; MULTILINEAR CIRCUITS;

INTEGRATING CIRCUITS; LOGIC CIRCUITS; POLYNOMIAL APPROXIMATION; THEOREM PROVING;

ALGORITHMS;

EID: 77954701873     PISSN: 07378017     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1806689.1806779     Document Type: Conference Paper

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